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Volumn 40, Issue 8, 2011, Pages 1757-1768

History-dependent impact ionization theory applied to HgCdTe e-APDs

(5) Rothman, Johan a Mollard, Laurent a Goût, Sylvain a Bonnefond, Leo a Wlassow, Jerôme a

Author keywords

APD; dead space; excess noise factor; gain; HgCdTe; history dependent multiplication; nonlocal impact ionization coefficient

Indexed keywords

APD; DEAD SPACE; EXCESS NOISE FACTOR; GAIN; HGCDTE; HISTORY-DEPENDENT MULTIPLICATION; NONLOCAL;

CURVE FITTING; ELECTRIC FIELDS; MERCURY COMPOUNDS;

IMPACT IONIZATION;

EID: 80051579204 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-011-1679-9 Document Type: Conference Paper

Times cited : (53)

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