-
1
-
-
0027626718
-
-
G. Leveque, M. Nasser, D. Bertho, B. Orsal and R. Alabedra, Semicond. Sci. Technol. 8, 1317 (1993)
-
(1993)
Semicond. Sci. Technol.
, vol.8
, pp. 1317
-
-
Leveque, G.1
Nasser, M.2
Bertho, D.3
Orsal, B.4
Alabedra, R.5
-
2
-
-
0032623388
-
-
T.J. de Lyon, B. Baumgratz, G. Chapman, E. Gordon, A.T. Hunter, M. Jack, J.E. Jensen, W. Johnson, B. Johs, K. Kosai, W. Larsen, G.L. Olson, M. Sen, and B. Walker, Proc. SPIE 3629, 256 (1999)
-
(1999)
Proc. SPIE
, vol.3629
, pp. 256
-
-
De Lyon, T.J.1
Baumgratz, B.2
Chapman, G.3
Gordon, E.4
Hunter, A.T.5
Jack, M.6
Jensen, J.E.7
Johnson, W.8
Johs, B.9
Kosai, K.10
Larsen, W.11
Olson, G.L.12
Sen, M.13
Walker, B.14
-
4
-
-
34548293246
-
-
Extended Abstracts, San Diego, California, 3-5 October
-
R.E. DeWames, J.G. Pasko, D.L. McConnell, J.S. Chen, J. Bajaj, L.O. Bubulac, E.S. Yao, G.L. Bostrup, R. Zucca, G.M. Williams, A.M. Blume, and T.P. Weismuller (Extended Abstracts, 1989 U.S. Workshop on the Physics and Chemistry of II-VI Materials, San Diego, California, 3-5 October 1989)
-
(1989)
1989 U.S. Workshop on the Physics and Chemistry of II-VI Materials
-
-
Dewames, R.E.1
Pasko, J.G.2
McConnell, D.L.3
Chen, J.S.4
Bajaj, J.5
Bubulac, L.O.6
Yao, E.S.7
Bostrup, G.L.8
Zucca, R.9
Williams, G.M.10
Blume, A.M.11
Weismuller, T.P.12
-
5
-
-
84955018580
-
-
C.T. Elliott, N.T. Gordon, R.S. Hall, G. Crimes and J. Vac, Sci. Technol. A8, 1251 (1990)
-
(1990)
J. Vac. Sci. Technol.
, vol.8
, pp. 1251
-
-
Elliott, C.T.1
Gordon, N.T.2
Hall, R.S.3
Crimes, G.4
-
6
-
-
0035761860
-
-
J.D. Beck, C.-F. Wan, M.A. Kinch and J.E. Robinson, Proc. SPIE 4454, 188 (2001)
-
(2001)
Proc. SPIE
, vol.4454
, pp. 188
-
-
Beck, J.D.1
Wan, C.-F.2
Kinch, M.A.3
Robinson, J.E.4
-
7
-
-
3042747316
-
-
M.A. Kinch, J.D. Beck, C.-F. Wan, F. Ma and J. Campbell, J. Electronic Mater. 33, 630 (2004)
-
(2004)
J. Electron. Mater.
, vol.33
, pp. 630
-
-
Kinch, M.A.1
Beck, J.D.2
Wan, C.-F.3
Ma, F.4
Campbell, J.5
-
8
-
-
0042513714
-
-
F. Ma, X. Li, J.C. Campbell, J.D. Beck, C.-F. Wan and M.A. Kinch, Appl. Phys. Lett. 83, 785 (2003)
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 785
-
-
Ma, F.1
Li, X.2
Campbell, J.C.3
Beck, J.D.4
Wan, C.-F.5
Kinch, M.A.6
-
10
-
-
19944426282
-
-
M. Vaidyanathan, A. Joshi, S. Xue, B. Hanyaloglu, M. Thomas, M. Zandian, D. Edwall, G. Williams, J. Blackwell, W. Tennant, and G. Hughes (2004 IEEE Aerospace Conference Proceedings, 2004), pp. 1776-1781
-
(2004)
2004 IEEE Aerospace Conference Proceedings
, pp. 1776-1781
-
-
Vaidyanathan, M.1
Joshi, A.2
Xue, S.3
Hanyaloglu, B.4
Thomas, M.5
Zandian, M.6
Edwall, D.7
Williams, G.8
Blackwell, J.9
Tennant, W.10
Hughes, G.11
-
11
-
-
26444458836
-
-
R.S. Hall, N.T. Gordon, J. Giess, J.E. Hails, A. Graham, D.C. Herbert, D.J. Hall, P. Southern, J.W. Cairns, D.J. Lees and T. Ashley, Proc. SPIE 5783, 412 (2005)
-
(2005)
Proc. SPIE
, vol.5783
, pp. 412
-
-
Hall, R.S.1
Gordon, N.T.2
Giess, J.3
Hails, J.E.4
Graham, A.5
Herbert, D.C.6
Hall, D.J.7
Southern, P.8
Cairns, J.W.9
Lees, D.J.10
Ashley, T.11
-
12
-
-
15944376893
-
-
J. Beck, C. Wan, M. Kinch, J. Robinson, P. Mitra, R. Scritchfield, F. Ma and J. Campbell, Proc. SPIE 5564, 44 (2004)
-
(2004)
Proc. SPIE
, vol.5564
, pp. 44
-
-
Beck, J.1
Wan, C.2
Kinch, M.3
Robinson, J.4
Mitra, P.5
Scritchfield, R.6
Ma, F.7
Campbell, J.8
-
13
-
-
33746255460
-
-
J. Beck, C. Wan, M. Kinch, J. Robinson, P. Mitra, R. Scritchfield, F. Ma and J. Campbell, J. Electron. Mater. 35, 1166 (2006)
-
(2006)
J. Electron. Mater.
, vol.35
, pp. 1166
-
-
Beck, J.1
Wan, C.2
Kinch, M.3
Robinson, J.4
Mitra, P.5
Scritchfield, R.6
Ma, F.7
Campbell, J.8
-
14
-
-
33750545118
-
-
P. Mitra, J.D. Beck, M.R. Skokan, J.E. Robinson, C.A. Musca, J.M. Dell and L. Faraone, Proc. SPIE 6295, 62950G (2006)
-
(2006)
Proc. SPIE
, vol.6295
-
-
Mitra, P.1
Beck, J.D.2
Skokan, M.R.3
Robinson, J.E.4
Musca, C.A.5
Dell, J.M.6
Faraone, L.7
-
15
-
-
34548234966
-
-
August, (to be published)
-
G. Perrais, O. Gravrand, J. Baylet, G. Destefanis and J. Rothman, J. Electronic Materials 36, August 2007 (to be published)
-
(2007)
J. Electronic Materials
, vol.36
-
-
Perrais, G.1
Gravrand, O.2
Baylet, J.3
Destefanis, G.4
Rothman, J.5
-
16
-
-
33750462373
-
-
M.B. Reine, J.W. Marciniec, K.K. Wong, T. Parodos, J.D. Mullarkey, P.A. Lamarre, S.P. Tobin, K.A. Gustavsen and G.M. Williams, Proc. SPIE 6294, 629503 (2006)
-
(2006)
Proc. SPIE
, vol.6294
, pp. 629403
-
-
Reine, M.B.1
Marciniec, J.W.2
Wong, K.K.3
Parodos, T.4
Mullarkey, J.D.5
Lamarre, P.A.6
Tobin, S.P.7
Gustavsen, K.A.8
Williams, G.M.9
-
17
-
-
0036059717
-
-
A. Biswas, B. Madden-Woods, M. Srinivasen, V. Vilnrotter and W. Farr, Proc. SPIE 4635, 72 (2002)
-
(2002)
Proc. SPIE
, vol.4635
, pp. 72
-
-
Biswas, A.1
Madden-Woods, B.2
Srinivasen, M.3
Vilnrotter, V.4
Farr, W.5
-
18
-
-
0036045030
-
-
A. Biswas, V. Vilnrotter, W. Farr, D. Fort and E. Sigman, Proc. SPIE 4635, 224 (2002)
-
(2002)
Proc. SPIE
, vol.4635
, pp. 224
-
-
Biswas, A.1
Vilnrotter, V.2
Farr, W.3
Fort, D.4
Sigman, E.5
-
19
-
-
15944385649
-
-
P. LoVecchio, K. Wong, T. Parodos, S.P. Tobin, M.A. Hutchins and P.W. Norton, Proc. SPIE 5564, 65 (2004)
-
(2004)
Proc. SPIE
, vol.5564
, pp. 65
-
-
Lovecchio, P.1
Wong, K.2
Parodos, T.3
Tobin, S.P.4
Hutchins, M.A.5
Norton, P.W.6
-
22
-
-
27144537735
-
-
M. Liu, S. Wang, J.C. Campbell, J.D. Beck, C.-F. Wan and M.A. Kinch, J. Appl. Phys. 98, 074509 (2005).
-
(2005)
J. Appl. Phys.
, vol.98
, pp. 074509
-
-
Liu, M.1
Wang, S.2
Campbell, J.C.3
Beck, J.D.4
Wan, C.-F.5
Kinch, M.A.6
|