MWIR HgCdTe avalanche photodiodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4454, Issue , 2001, Pages 188-197

  Beck, Jeffrey D ^a   Wan, Chang Feng ^a   Kinch, Michael A ^a   Robinson, James E ^a  

^a DRS Sensors and Targeting Systems Inc   (United States)

Author keywords

APD; Avalanche photodiode; Bandwidth; Excess noise; Gain; HgCdTe; Infrared; Ionization ratio; Mercury cadmium telluride; Rise time

Indexed keywords

AVALANCHE DIODES; DIFFUSION; ELECTRONS; GAIN MEASUREMENT; GEOMETRY; IONIZATION; MERCURY COMPOUNDS; PHOTODIODES;

AVALANCHE PHOTODIODE; IONIZATION RATIO; MERCURY CADMIUM TELLURIDE; RISE TIME;

INFRARED DETECTORS;

EID: 0035761860     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.448174     Document Type: Conference Paper

References (7)

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5. Unpublished data
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