New dialkyldithiophosphinic acid self-assembled monolayers (SAMs): Influence of gold substrate morphology on adsorbate binding and SAM structure

Langmuir

Volumn 27, Issue 16, 2011, Pages 10019-10026

  Miller, Michael S ^a   Juan, Ronan R San ^a   Ferrato, Michael Anthony ^a   Carmichael, Tricia Breen ^a  

^a UNIVERSITY OF WINDSOR   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALKYL CHAIN; BARRIER PROPERTIES; ELECTRON BEAM EVAPORATION; FRICTIONAL RESPONSE; GOLD SUBSTRATES; GOLD SURFACES; LOW DENSITY; MONODENTATES; SAMS; TEMPLATE STRIPPING;

ADSORBATES; CHELATION; GOLD; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MOLECULES; MORPHOLOGY; SELF ASSEMBLED MONOLAYERS; SURFACE MORPHOLOGY;

SUBSTRATES;

EID: 80051491647     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la202007q     Document Type: Article

References (47)

1. Kim, D. S. Bull. Korean Chem. Soc. 1995, 16, 321-325
2. Hope, G. A.; Woods, R.; Watling, K. Colloids. Surf. A 2003, 214, 87-97
3. Hope, G. A.; Woods, R.; Boyd, S.; Watling, K. Colloids. Surf. A 2003, 214, 77-85
4. Hope, G. A.; Woods, R.; Watling, K. J. Appl. Electrochem. 2001, 31, 1285-1291
5. Love, J. C.; Estroff, L. A.; Kriebel, J. K.; Nuzzo, R. G.; Whitesides, G. M. Chem. Rev. 2005, 105, 1103-1169
6. Trevor, D. J.; Chidsey, C. E. D.; Loiacono, D. N. Phys. Rev. Lett. 1989, 62, 929-932
7. Wagner, P.; Hegner, M.; Guntherodt, H. -J.; Semenza, G. Langmuir 1995, 11, 3867-3875
8. Weiss, E. A.; Kaufman, G. K.; Kriebel, J. K.; Li, Z.; Schalek, R.; Whitesides, G. M. Langmuir 2007, 23, 9686-9694
9. Naumann, R.; Schiller, S. M.; Giess, F.; Grohe, B.; Hartman, K. B.; Karcher, I.; Koper, I.; Lubben, J.; Vasilev, K.; Knoll, W. Langmuir 2003, 19, 5435-5443
10. Hegner, M.; Wagner, P.; Semenza, G. Surf. Sci. 1993, 291, 39-46
11. Wagner, P.; Zaugg, F.; Kernen, P.; Hegner, M.; Semenza, G. J. Vac. Sci. Technol. B 1996, 14, 1466-1471
12. Gupta, P.; Ulman, A.; Fanfan, S.; Korniakov, A.; Loos, K. J. Am. Chem. Soc. 2005, 127, 4-5
13. Gupta, P.; Loos, K.; Korniakov, A.; Spagnoli, C.; Cowman, M.; Ulman, A. Angew. Chem., Int. Ed. 2004, 43, 520-523
14. Weiss, E. A.; Chiechi, R. C.; Kaufman, G. K.; Kriebel, J. K.; Li, Z.; Duati, M.; Rampi, M. A.; Whitesides, G. M. J. Am. Chem. Soc. 2007, 129, 4336-4349
15. Engelkes, V. B.; Beebe, J. M.; Frisbie, C. D. J. Phys. Chem. B 2005, 109, 16801-16810
16. Von Wrochem, F.; Gao, D.; Scholz, F.; Nothofer, H. -G.; Nelles, G.; Wessels, J. M. Nat. Nanotechnol. 2010, 5, 618-624
17. Shon, Y.-S.; Colorado, R., Jr.; Williams, C. T.; Bain, C. D.; Lee, T. R. Langmuir 2000, 16, 541-548
18. Park, J.-S.; Smith, A. C.; Lee, T. R. Langmuir 2004, 20, 5829-5836
19. Park, J.-S.; Vo, A. N.; Barriet, D.; Shon, Y.-S.; Lee, T. R. Langmuir 2005, 21, 2902-2911
20. Weidner, T.; Kramer, A.; Bruhn, C.; Zharnikov, M.; Shaporenko, A.; Siemeling, U.; Trager, F. Dalton Trans. 2006, 2767-2777
21. Zhaom, Y.; Perez-Segarra, W.; Shi, Q.; Wei, A. J. Am. Chem. Soc. 2005, 127, 7328-7329
22. Morf, P.; Raimondi, F.; Nothofer, H.-G.; Schnyder, B.; Yasuda, A.; Wessels, J. M.; Jung, T. A. Langmuir 2006, 22, 658-663
23. Weinstein, R. D.; Richards, J.; Thai, S. D.; Omiatek, D. M.; Bessel, C. A.; Faulkner, C. J.; Othman, S.; Jennings, G. K. Langmuir 2007, 23, 2887-2891
24. Lee, T. -C.; Hounihan, D. J.; Colorado, R., Jr.; Park, J.-S.; Lee, T. R. J. Phys. Chem. B 2004, 108, 2648-2653
25. Iha, A.; Uvdal, K.; Liedberg, B. Langmuir 1993, 9, 733-739
26. Beattie, D. A.; Kempson, I. M.; Fan, L.-J.; Skinner, W. M. Int. J. Miner. Process 2009, 92, 162-168
27. Kumar, A.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1994, 10, 1498-1511
28. Horcas, I.; Fernandez, R.; Gomez-Rodriguez, J. M.; Colchero, J.; Gomez-Herrero, J.; Baro, A. M. Rev. Sci. Instrum. 2007, 78, 013705
29. Moulder, J. F.; Stickle, W. F.; Sobol, P. E.; Bomben, K. D. Handbook of X-Ray Photoelectron Spectroscopy; Physical Electronics: Eden Prairie, MN, 1995.
30. Guoxin, T.; Yongjun, Z.; Jingming, X. Solvent Extr. Ion Exch. 2001, 19, 993-1005
31. Schoenfisch, M. H.; Pemberton, J. E. J. Am. Chem. Soc. 1998, 120, 4502-4513
32. Hutt, D. A.; Leggett, G. J. J. Phys. Chem. 1996, 100, 6657-6662
33. Castner, D. G.; Hinds, K.; Grainger, D. W. Langmuir 1996, 12, 5083-5086
34. Ishida, T.; Choi, N.; Mizutani, W.; Tokumoto, H.; Kojima, I.; Azehara, H.; Hokari, H.; Akiba, U.; Fujihira, M. Langmuir 1999, 15, 6799-6806
35. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559-3568
36. Bubert, H.; Jenett, H. Surface and Thin Film Analysis; Wiley-VCH: Weinheim, Germany, 2002; p 250.
37. Yan, D.; Saunders, J. A.; Jennings, G. K. Langmuir 2000, 16, 7562-7565
38. Adamson, A. W.; Gast, A. P. Physical Chemistry of Surfaces, 6 th ed.; Wiley & Sons: New York, 1997; p 358.
39. Ulman, A. An Introduction to Ultrathin Organic Films; Academic Press: Boston, 1991.
40. Tao, Y.-T. J. Am. Chem. Soc. 1993, 115, 4350
41. Tao, Y.-T.; Lee, M.-T.; Chang, S.-C. J. Am. Chem. Soc. 1993, 115, 9547
42. Lio, A.; Charych, D. H.; Salmeron, M. J. Phys. Chem. B 1997, 101, 3800-3805
43. Barsoukov, E.; Macdonald, J. R. Impedance Spectroscopy, 2 nd ed.; Wiley & Sons: New York, 2005.
44. Jennings, G. K.; Munro, J. C.; Yong, T.-H.; Laibinis, P. E. Langmuir 1998, 14, 6130-6139
45. Peterlinz, K. A.; Georgiadis, R. Langmuir 1996, 12, 4731-4740
46. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321-335
47. Shon, Y.-S.; Lee, T. R. J. Phys. Chem. B 2000, 104, 8192-8200