-
3
-
-
0342459190
-
-
Laibinis, P. E.; Whitesides, G. M.; Allara, D. L.; Tao, Y.-T.; Parikh, A. N.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152-7167.
-
(1991)
J. Am. Chem. Soc.
, vol.113
, pp. 7152-7167
-
-
Laibinis, P.E.1
Whitesides, G.M.2
Allara, D.L.3
Tao, Y.-T.4
Parikh, A.N.5
Nuzzo, R.G.6
-
5
-
-
0030590366
-
-
Jennings, G. K.; Laibinis, P. E.; Colloids Surf., A 1996, 116, 105-114.
-
(1996)
Colloids Surf., A
, vol.116
, pp. 105-114
-
-
Jennings, G.K.1
Laibinis, P.E.2
-
6
-
-
0027542650
-
-
Yamamoto, Y.; Nishihara, H.; Aramaki, K. J. Electrochem. Soc. 1993, 140, 436-443.
-
(1993)
J. Electrochem. Soc.
, vol.140
, pp. 436-443
-
-
Yamamoto, Y.1
Nishihara, H.2
Aramaki, K.3
-
7
-
-
0029406092
-
-
Itoh, M.; Nishihara, H.; Aramaki, K. J. Electrochem. Soc. 1995, 142, 3696-3704.
-
(1995)
J. Electrochem. Soc.
, vol.142
, pp. 3696-3704
-
-
Itoh, M.1
Nishihara, H.2
Aramaki, K.3
-
8
-
-
0000811022
-
-
Ishibashi, M.; Itoh, M.; Nishihara, H.; Aramaki, K. Electrochim. Acta 1996, 41, 241-248.
-
(1996)
Electrochim. Acta
, vol.41
, pp. 241-248
-
-
Ishibashi, M.1
Itoh, M.2
Nishihara, H.3
Aramaki, K.4
-
9
-
-
0030871139
-
-
Feng, Y.; Teo, W.-K.; Siow, K.-S.; Gao, Z.; Tan, K.-L.; Hseih, A.-K. J. Electrochem. Soc. 1997, 144, 55-64.
-
(1997)
J. Electrochem. Soc.
, vol.144
, pp. 55-64
-
-
Feng, Y.1
Teo, W.-K.2
Siow, K.-S.3
Gao, Z.4
Tan, K.-L.5
Hseih, A.-K.6
-
10
-
-
0031356064
-
-
Scherer, J.; Vogt, M. R.; Magnussen, O. M.; Behm, R. J. Langmuir 1997, 13, 7045-7051.
-
(1997)
Langmuir
, vol.13
, pp. 7045-7051
-
-
Scherer, J.1
Vogt, M.R.2
Magnussen, O.M.3
Behm, R.J.4
-
11
-
-
0032477657
-
-
Zamborini, F. P.; Campbell, J. K.; Crooks, R. M.; Langmuir 1998, 14, 640-647.
-
(1998)
Langmuir
, vol.14
, pp. 640-647
-
-
Zamborini, F.P.1
Campbell, J.K.2
Crooks, R.M.3
-
13
-
-
0028486062
-
-
Itoh, M.; Nishihara, H.; Aramaki, K. J. Electrochem. Soc. 1994, 141, 2018-2023.
-
(1994)
J. Electrochem. Soc.
, vol.141
, pp. 2018-2023
-
-
Itoh, M.1
Nishihara, H.2
Aramaki, K.3
-
14
-
-
0029327056
-
-
Itoh, M.; Nishihara, H.; Aramaki, K. J. Electrochem. Soc. 1995, 142, 1839-1846.
-
(1995)
J. Electrochem. Soc.
, vol.142
, pp. 1839-1846
-
-
Itoh, M.1
Nishihara, H.2
Aramaki, K.3
-
15
-
-
0001318962
-
Electrochemistry of Organized Monolayers of Thiols and Related Molecules on Electrodes
-
Bard, A. J., Rubinstein, I., Eds.; Marcel Dekker: New York
-
Finklea, H. O. Electrochemistry of Organized Monolayers of Thiols and Related Molecules on Electrodes. In Electroanalytical Chemistry; Bard, A. J., Rubinstein, I., Eds.; Marcel Dekker: New York, 1996; Vol. 19, pp 109-335.
-
(1996)
Electroanalytical Chemistry
, vol.19
, pp. 109-335
-
-
Finklea, H.O.1
-
16
-
-
0027814402
-
-
Finklea, H. O.; Snider, D. A.; Fedyk, J.; Sabatani, E.; Gafni, Y.; Rubinstein, I. Langmuir 1993, 9, 3660-3667.
-
(1993)
Langmuir
, vol.9
, pp. 3660-3667
-
-
Finklea, H.O.1
Snider, D.A.2
Fedyk, J.3
Sabatani, E.4
Gafni, Y.5
Rubinstein, I.6
-
17
-
-
0001334350
-
-
Zhao, M.; Zhou, Y.; Bruening, M. L.; Bergbreiter, D. E.; Crooks, R. M. Langmuir 1997, 13, 1388-1391.
-
(1997)
Langmuir
, vol.13
, pp. 1388-1391
-
-
Zhao, M.1
Zhou, Y.2
Bruening, M.L.3
Bergbreiter, D.E.4
Crooks, R.M.5
-
19
-
-
0030261031
-
-
Mitton, D. B.; Latanision, R. M.; Bellucci, F. J. Electrochem. Soc. 1996, 143, 3307-3316.
-
(1996)
J. Electrochem. Soc.
, vol.143
, pp. 3307-3316
-
-
Mitton, D.B.1
Latanision, R.M.2
Bellucci, F.3
-
20
-
-
0001057845
-
-
Abrahamsson, S.; Larsson, G.; von Sydlow, E. Acta Crystallogr. 1960, 13, 770-774.
-
(1960)
Acta Crystallogr.
, vol.13
, pp. 770-774
-
-
Abrahamsson, S.1
Larsson, G.2
Von Sydlow, E.3
-
21
-
-
0000992383
-
-
Laibinis, P. E.; Bain, C. D.; Whitesides, G. M. J. Phys. Chem. 1991, 95, 7017-7021.
-
(1991)
J. Phys. Chem.
, vol.95
, pp. 7017-7021
-
-
Laibinis, P.E.1
Bain, C.D.2
Whitesides, G.M.3
-
22
-
-
0028436508
-
-
9 demonstrate the importance of achiving an oxide-free copper surface before self-assembly as thiol adsorbates exhibit poor interaction with CuO and have been reported to form multilayers when assembled under aerobic conditions (see Keller et al. Thin Solid Films 1994, 244, 799-805.)
-
(1994)
Thin Solid Films
, vol.244
, pp. 799-805
-
-
Keller1
-
23
-
-
0006163257
-
-
Porter, M.; D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559-3568.
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 3559-3568
-
-
Porter, M.D.1
Bright, T.B.2
Allara, D.L.3
Chidsey, C.E.D.4
-
26
-
-
33845553283
-
-
Ikeda, T.; Schmehl, R.; Denisevich, P.; Willman, K.; Murray, R. W. J. Am. Chem. Soc. 1982, 104, 2683-2001.
-
(1982)
J. Am. Chem. Soc.
, vol.104
, pp. 2683-12001
-
-
Ikeda, T.1
Schmehl, R.2
Denisevich, P.3
Willman, K.4
Murray, R.W.5
-
27
-
-
9144258943
-
-
Conductivity is expected to decrease exponentially with film thickness if electron tunneling is the primary mode of charge transfer (Simmons, J. G. J. Appl. Phys. 1963, 34, 1793).
-
(1963)
J. Appl. Phys.
, vol.34
, pp. 1793
-
-
Simmons, J.G.1
-
28
-
-
7544228907
-
-
Boulas, C.; Davidovits, J. F.; Rondelez, F.; Vuillaume, D. Phys. Rev. Lett. 1996, 76, 4797-4800.
-
(1996)
Phys. Rev. Lett.
, vol.76
, pp. 4797-4800
-
-
Boulas, C.1
Davidovits, J.F.2
Rondelez, F.3
Vuillaume, D.4
-
29
-
-
4243806463
-
-
Bareman, J. P.; Cardini, G.; Klein, M. L. Phys. Rev. Lett. 1988, 60, 2152-2155.
-
(1988)
Phys. Rev. Lett.
, vol.60
, pp. 2152-2155
-
-
Bareman, J.P.1
Cardini, G.2
Klein, M.L.3
-
30
-
-
11744313008
-
-
The increase in methylene intensity is not likely the result of adventitious carbon contamination, as all the samples studied expose low-energy methyl surfaces that are resistant to the adsorption of foreign species
-
The increase in methylene intensity is not likely the result of adventitious carbon contamination, as all the samples studied expose low-energy methyl surfaces that are resistant to the adsorption of foreign species.
-
-
-
-
31
-
-
0002762886
-
-
Bellucci, F.; Kloppers, M.; Latanision, R. M. J. Electrochem. Soc. 1991, 138, 40-48.
-
(1991)
J. Electrochem. Soc.
, vol.138
, pp. 40-48
-
-
Bellucci, F.1
Kloppers, M.2
Latanision, R.M.3
-
33
-
-
0032565126
-
-
This observation of stability is based on IR results for samples stored at ambient conditions in the dark. The stability of these SAMs is reported to be diminished by exposure to UV light or ozone (Zhang, Y.; Terrill, R. H.; Tanzer, T. A.; Bohn, P. W. J. Am. Chem. Soc. 1998, 120, 2654-2655. Norrod, K. L.; Rowlen, K. L. J. Am. Chem. Soc. 1998, 120, 2656-2657. Reference 34).
-
(1998)
J. Am. Chem. Soc.
, vol.120
, pp. 2654-2655
-
-
Zhang, Y.1
Terrill, R.H.2
Tanzer, T.A.3
Bohn, P.W.4
-
34
-
-
0032565127
-
-
Reference 34
-
This observation of stability is based on IR results for samples stored at ambient conditions in the dark. The stability of these SAMs is reported to be diminished by exposure to UV light or ozone (Zhang, Y.; Terrill, R. H.; Tanzer, T. A.; Bohn, P. W. J. Am. Chem. Soc. 1998, 120, 2654-2655. Norrod, K. L.; Rowlen, K. L. J. Am. Chem. Soc. 1998, 120, 2656-2657. Reference 34).
-
(1998)
J. Am. Chem. Soc.
, vol.120
, pp. 2656-2657
-
-
Norrod, K.L.1
Rowlen, K.L.2
-
36
-
-
1942481178
-
-
Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321-335.
-
(1989)
J. Am. Chem. Soc.
, vol.111
, pp. 321-335
-
-
Bain, C.D.1
Troughton, E.B.2
Tao, Y.-T.3
Evall, J.4
Whitesides, G.M.5
Nuzzo, R.G.6
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