-
3
-
-
0028404595
-
-
Huang, J.; Dahlgren, D.; Hemminger, J. C. Langmuir 1994, 10, 626.
-
(1994)
Langmuir
, vol.10
, pp. 626
-
-
Huang, J.1
Dahlgren, D.2
Hemminger, J.C.3
-
4
-
-
0001587868
-
-
Friebel, S.; Aizenberg, J.; Abad, S.; Wiltzius, P. Appl. Phys. Lett. 2000, 77, 2406.
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 2406
-
-
Friebel, S.1
Aizenberg, J.2
Abad, S.3
Wiltzius, P.4
-
5
-
-
0011374240
-
-
Green, J.-B. D.; McDermott, M. T.; Porter, M. D. J. Phys. Chem. 1995, 99, 10965 and references contained therein.
-
(1995)
J. Phys. Chem.
, vol.99
, pp. 10965
-
-
Green, J.-B.D.1
McDermott, M.T.2
Porter, M.D.3
-
9
-
-
33751154943
-
-
Xia, Y.; Zhao, X.-M.; Kim, E.; Whitesides, G. M. Chem. Mater. 1995, 7, 2332.
-
(1995)
Chem. Mater.
, vol.7
, pp. 2332
-
-
Xia, Y.1
Zhao, X.-M.2
Kim, E.3
Whitesides, G.M.4
-
10
-
-
33645950259
-
-
Katz, E.; Itzhak, N.; Willner, I. J. Electroanal. Chem. 1992, 336, 357.
-
(1992)
J. Electroanal. Chem.
, vol.336
, pp. 357
-
-
Katz, E.1
Itzhak, N.2
Willner, I.3
-
13
-
-
0033728065
-
-
Garg, N.; Friedman, J. M.; Lee, T. R. Langmuir 2000, 16, 4266.
-
(2000)
Langmuir
, vol.16
, pp. 4266
-
-
Garg, N.1
Friedman, J.M.2
Lee, T.R.3
-
15
-
-
0032181871
-
-
Colorado, R., Jr.; Villazana, R. J.; Lee, T. R. Langmuir 1998, 14, 6337.
-
(1998)
Langmuir
, vol.14
, pp. 6337
-
-
Colorado Jr., R.1
Villazana, R.J.2
Lee, T.R.3
-
16
-
-
84987216774
-
-
Ramadas, S. R.; Srinivasan, P. S.; Ramachandran, J.; Sastry, V. V. S. K. Synthesis 1983, 605.
-
(1983)
Synthesis
, pp. 605
-
-
Ramadas, S.R.1
Srinivasan, P.S.2
Ramachandran, J.3
Sastry, V.V.S.K.4
-
17
-
-
0006163257
-
-
Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 2358.
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 2358
-
-
Porter, M.D.1
Bright, T.B.2
Allara, D.L.3
Chidsey, C.E.D.4
-
18
-
-
0033639811
-
-
Shon, Y.-S.; Colorado, R., Jr.; Williams, C. T.; Bain, C. D.; Lee, T. R. Langmuir 2000, 16, 541.
-
(2000)
Langmuir
, vol.16
, pp. 541
-
-
Shon, Y.-S.1
Colorado Jr., R.2
Williams, C.T.3
Bain, C.D.4
Lee, T.R.5
-
19
-
-
0031647192
-
-
Hutt, D. A.; Cooper, E.; Leggett, G. J. J. Phys. Chem. B 1998, 102, 174.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 174
-
-
Hutt, D.A.1
Cooper, E.2
Leggett, G.J.3
-
21
-
-
1542273830
-
-
note
-
The fraction of SAM remaining on the surface can be obtained from the relative ellipsometric thicknesses as a function of time. Although a plot of the fraction of SAM remaining vs time would illustrate more clearly the relationship between chain length and decomposition rate, we chose to provide the actual ellipsometric thicknesses for the purpose of future reference.
-
-
-
-
23
-
-
1542363756
-
-
note
-
Unlike the initial ellipsometric thicknesses, the initial contact angles of the ADTCA SAMs are roughly the same for all chain lenghts investigated. The effect of chain length on the rate of decomposition shown in Figure 4, therefore, appears more pronounced than that in Figure 2.
-
-
-
-
24
-
-
0342459190
-
-
Laibinis, P. E.; Whitesides, G. M.; Allara, D. L.; Tao, Y.-T.; Parikh, A. N.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152.
-
(1991)
J. Am. Chem. Soc.
, vol.113
, pp. 7152
-
-
Laibinis, P.E.1
Whitesides, G.M.2
Allara, D.L.3
Tao, Y.-T.4
Parikh, A.N.5
Nuzzo, R.G.6
-
25
-
-
0025366704
-
-
Nuzzo, R. G.; Dubois, L. H.; Allara, D. L. J. Am. Chem. Soc. 1990, 112, 558.
-
(1990)
J. Am. Chem. Soc.
, vol.112
, pp. 558
-
-
Nuzzo, R.G.1
Dubois, L.H.2
Allara, D.L.3
-
26
-
-
0006163257
-
-
Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559.
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 3559
-
-
Porter, M.D.1
Bright, T.B.2
Allara, D.L.3
Chidsey, C.E.D.4
-
27
-
-
0001293239
-
-
Castner, D. G.; Hinds, K.; Grainger, D. W. Langmuir 1996, 12, 5083.
-
(1996)
Langmuir
, vol.12
, pp. 5083
-
-
Castner, D.G.1
Hinds, K.2
Grainger, D.W.3
-
29
-
-
0001277871
-
-
Ihs, A.; Uvdal, K.; Liedberg, B. Langmuir 1993, 9, 733.
-
(1993)
Langmuir
, vol.9
, pp. 733
-
-
Ihs, A.1
Uvdal, K.2
Liedberg, B.3
-
31
-
-
0043281730
-
-
Li, Y.; Huang, J.; McIver, Jr., R. T.; Hemminger, J. C. J. Am. Chem. Soc. 1992, 114, 2428.
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 2428
-
-
Li, Y.1
Huang, J.2
McIver Jr., R.T.3
Hemminger, J.C.4
-
33
-
-
0000975032
-
-
Lewis, M.; Tarlov, M.; Carron, K. J. Am. Chem. Soc. 1995, 117, 9574.
-
(1995)
J. Am. Chem. Soc.
, vol.117
, pp. 9574
-
-
Lewis, M.1
Tarlov, M.2
Carron, K.3
-
34
-
-
0542413972
-
-
Tarlov, M. J.; Burgess, Jr. D. R. F.; Gillen, G. J. Am. Chem. Soc. 1993, 115, 5305.
-
(1993)
J. Am. Chem. Soc.
, vol.115
, pp. 5305
-
-
Tarlov, M.J.1
Burgess Jr., D.R.F.2
Gillen, G.3
-
35
-
-
1942481178
-
-
Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321.
-
(1989)
J. Am. Chem. Soc.
, vol.111
, pp. 321
-
-
Bain, C.D.1
Troughton, E.B.2
Tao, Y.-T.3
Evall, J.4
Whitesides, G.M.5
Nuzzo, R.G.6
-
40
-
-
1542333996
-
-
Manuscript in preparation
-
Preliminary studies have found that ADTCA-based SAMs serve as efficient etch resists in conventional soft lithographic patterning strategies: Lee, T.-C.; Colorado, R., Jr.; Lee, T. R. Manuscript in preparation.
-
-
-
Lee, T.-C.1
Colorado Jr., R.2
Lee, T.R.3
|