-
1
-
-
0003158656
-
Hitting the memorywall: Implications of the obvious
-
Mar.
-
W. A. Wulf and S. A. McKee, "Hitting the memorywall: Implications of the obvious," Comput. Arch. News, vol. 23, pp. 20-24, Mar. 1995.
-
(1995)
Comput. Arch. News
, vol.23
, pp. 20-24
-
-
Wulf, W.A.1
McKee, S.A.2
-
2
-
-
28344453642
-
Bridging the processor-memory performance gap with 3D IC technology
-
DOI 10.1109/MDT.2005.134
-
C. C. Liu, I. Ganusov, M. Burtscher, and S. Tiwari, "Bridging the processor- memory performance gap with 3D IC technology," IEEE Des. Test Comput., vol. 22, no. 6, pp. 556-564, Nov.-Dec. 2005. (Pubitemid 41715963)
-
(2005)
IEEE Design and Test of Computers
, vol.22
, Issue.6
, pp. 556-564
-
-
Liu, C.C.1
Ganusov, I.2
Burtscher, M.3
Tiwari, S.4
-
3
-
-
34547476643
-
Picoserver: Using 3D stacking technology to enable a compact energy efficient chip multiprocessor
-
T. H. Kgil, A. Saidi, N. Binkert, R. Dreslinski, S. Reinhardt, K. Flautner, and T. Mudge, "Picoserver: Using 3D stacking technology to enable a compact energy efficient chip multiprocessor," in Proc. 12th Symp. Arch. Support for Program. Lang. Operat. Syst., 2006.
-
(2006)
Proc. 12th Symp. Arch. Support for Program. Lang. Operat. Syst.
-
-
Kgil, T.H.1
Saidi, A.2
Binkert, N.3
Dreslinski, R.4
Reinhardt, S.5
Flautner, K.6
Mudge, T.7
-
4
-
-
40349090128
-
Die stacking (3D) microarchitecture
-
DOI 10.1109/MICRO.2006.18, 4041869, Proceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO-39
-
B. Black, M. Annavaram, N. Brekelbaum, J. Devale, L. Jiang, G. H. Loh, D. Mccauley, P. Morrow, D. W. Nelson, D. Pantuso, P. Reed, J. Rupley, S. Shankar, J. Shen, and C.Webb, "Die stacking (3D) microarchitecture," in Proc. Annu. IEEE/ACM Int. Symp. Microarch., 2006, pp. 469-479. (Pubitemid 351337019)
-
(2006)
Proceedings of the Annual International Symposium on Microarchitecture, MICRO
, pp. 469-479
-
-
Black, B.1
Annavaram, M.2
Brekelbaum, N.3
Devale, J.4
Lei, J.5
Loh, G.H.6
McCauley, D.7
Morrow, P.8
Nelson, D.W.9
Pantuso, D.10
Reed, P.11
Rupley, J.12
Shankar, S.13
John, S.14
Webb, C.15
-
5
-
-
34548359365
-
Processor design in 3D die-stacking technologies
-
DOI 10.1109/MM.2007.59
-
G. H. Loh, Y. Xie, and B. Black, "Processor design in 3D die-stacking technologies," IEEE Micro, vol. 27, no. 3, pp. 31-48, May-Jun. 2007. (Pubitemid 47337546)
-
(2007)
IEEE Micro
, vol.27
, Issue.3
, pp. 31-48
-
-
Loh, G.H.1
Xie, Y.2
Black, B.3
-
6
-
-
52649125840
-
3D-stacked memory architecture for multi-core processors
-
Jun.
-
G. H. Loh, "3D-stacked memory architecture for multi-core processors," in Proc. 35th ACM/IEEE Int. Conf. Comput. Arch., Jun. 2008, pp. 453-464.
-
(2008)
Proc. 35th ACM/IEEE Int. Conf. Comput. Arch.
, pp. 453-464
-
-
Loh, G.H.1
-
7
-
-
61649087224
-
Is 3D chip technology the next growth engine for performance improvement?
-
Nov.
-
P. G. Emma and E. Kursun, "Is 3D chip technology the next growth engine for performance improvement?," IBM J. Res. Develop., vol. 32, no. 6, pp. 541-552, Nov. 2008.
-
(2008)
IBM J. Res. Develop.
, vol.32
, Issue.6
, pp. 541-552
-
-
Emma, P.G.1
Kursun, E.2
-
9
-
-
84870644143
-
-
Hewlett-Packard Labs Palo Alto CA. [Online]. Available
-
Hewlett-Packard Labs, Palo Alto, CA, "CACTI: An integrated cache and memory access time, cycle time, area, leakage, and dynamic power model," 2008. [Online]. Available: http://www.hpl.hp.com/research/ cacti/
-
(2008)
CACTI: An Integrated cache and Memory Access Time, Cycle Time, Area, Leakage, and Dynamic Power Model
-
-
-
11
-
-
61549131161
-
3-D hyperintegration and packaging technologies for micronano systems
-
Jan.
-
J.-Q. Lu, "3-D hyperintegration and packaging technologies for micronano systems," Proc. IEEE, vol. 97, no. 1, pp. 18-30, Jan. 2009.
-
(2009)
Proc. IEEE
, vol.97
, Issue.1
, pp. 18-30
-
-
Lu, J.-Q.1
-
12
-
-
33947377467
-
An industry perspective on current and future state of the art in system-on-chip (SoC) technology
-
DOI 10.1109/JPROC.2006.873616
-
T. A. C. M. Claasen, "An industry perspective on current and future state of the art in system-on-chip (SoC) technology," Proc. IEEE, vol. 94, no. 6, pp. 1121-1137, Jun. 2006. (Pubitemid 46444962)
-
(2006)
Proceedings of the IEEE
, vol.94
, Issue.6
, pp. 1121-1137
-
-
Claasen, T.A.C.M.1
-
13
-
-
34547571626
-
Wafer-level three-dimensional hyper-integration technology using dielectric adhesive wafer bonding
-
E. Zschech C. Whelan, and T. Mikolajick, Eds. London, U.K.: Springer-Verlag
-
J.-Q. Lu, T. S. Cale, and R. J. Gutmann, "Wafer-level three-dimensional hyper-integration technology using dielectric adhesive wafer bonding," in Materials for Information Technology: Devices, Interconnects and Packaging, E. Zschech, C. Whelan, and T. Mikolajick, Eds. London, U.K.: Springer-Verlag, 2005, pp. 386-397.
-
(2005)
Materials for Information Technology: Devices, Interconnects and Packaging
, pp. 386-397
-
-
Lu, J.-Q.1
Cale, T.S.2
Gutmann, R.J.3
-
14
-
-
79960980900
-
Structures and electrical performance of through strata vias (TSVs)
-
Oct.
-
Z. Xu, A. Beece, K. Rose, and J.-Q. Lu, "Structures and electrical performance of through strata vias (TSVs)," in Proc. Int. Wafer-Level Packag. Conf., Oct. 2009, pp. 24-26.
-
(2009)
Proc. Int. Wafer-Level Packag. Conf.
, pp. 24-26
-
-
Xu, Z.1
Beece, A.2
Rose, K.3
Lu, J.-Q.4
-
15
-
-
61649092607
-
Fabrication and characterization of robust through-silicon vias for silicon-carrier applications
-
Nov.
-
P. S. Andry, C. K. Tsang, B. C. Webb, E. J. Sprogis, S. L. Wright, B. Dang, and D. G. Manzer, "Fabrication and characterization of robust through-silicon vias for silicon-carrier applications," IBM J. Res. Develop., vol. 52, p. 571, Nov. 2008.
-
(2008)
IBM J. Res. Develop.
, vol.52
, pp. 571
-
-
Andry, P.S.1
Tsang, C.K.2
Webb, B.C.3
Sprogis, E.J.4
Wright, S.L.5
Dang, B.6
Manzer, D.G.7
-
16
-
-
0346076629
-
Contact resistance measurement of bonded copper interconnects for three-dimensional integration technology
-
Jan.
-
K. N. Chen, A. Fan, C. S. Tan, and R. Reif, "Contact resistance measurement of bonded copper interconnects for three-dimensional integration technology," IEEE Electron Device Lett., vol. 25, no. 1, pp. 20-22, Jan. 2004.
-
(2004)
IEEE Electron Device Lett.
, vol.25
, Issue.1
, pp. 20-22
-
-
Chen, K.N.1
Fan, A.2
Tan, C.S.3
Reif, R.4
-
17
-
-
79961007019
-
-
INTEL Corporation Santa Clara CA. [Online]. Available
-
INTEL Corporation, Santa Clara, CA, "Xeon processors," 2009. [Online]. Available: http://www.intel.com
-
(2009)
Xeon Processors
-
-
-
18
-
-
0004245602
-
-
Semiconductor Industry Association. [Online]. Available
-
Semiconductor Industry Association, "The international technology roadmap for semiconductors (ITRS)," 2007. [Online]. Available: http://www.itrs.net/Links/2007ITRS/Home2007.htm
-
(2007)
The International Technology Roadmap for Semiconductors (ITRS)
-
-
-
20
-
-
47949124019
-
Power delivery for 3D chip stacks: Physical modeling and design implication
-
Atlanta, GA Oct.
-
G. Huang, M. Bakir, A. Naeemi, H. Chen, and J. D. Meindl, "Power delivery for 3D chip stacks: Physical modeling and design implication," in Proc. Elect. Perform. Electron. Packag., Atlanta, GA, Oct. 2007, pp. 205-208.
-
(2007)
Proc. Elect. Perform. Electron. Packag.
, pp. 205-208
-
-
Huang, G.1
Bakir, M.2
Naeemi, A.3
Chen, H.4
Meindl, J.D.5
-
22
-
-
33750598564
-
Fast decap allocation algorithm for robust on-chip power delivery
-
Z. Qi, H. Li, S. Tan, L. Wu, Y. Cai, and X. Hong, "Fast decap allocation algorithm for robust on-chip power delivery," in Proc. Int. Symp. Quality Electron. Des. (ISQED), 2005, pp. 542-547.
-
(2005)
Proc. Int. Symp. Quality Electron. Des. (ISQED)
, pp. 542-547
-
-
Qi, Z.1
Li, H.2
Tan, S.3
Wu, L.4
Cai, Y.5
Hong, X.6
|