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Volumn 19, Issue 9, 2011, Pages 1655-1666

Design techniques to facilitate processor power delivery in 3-D processor-DRAM integrated systems

Author keywords

3 D integration; decoupling capacitor; instructions per cycle (IPC); IR drop; power delivery; processor DRAM integrated system; through silicon via (TSV)

Indexed keywords

3-D INTEGRATION; DECOUPLING CAPACITOR; INSTRUCTIONS PER CYCLES; INTEGRATED SYSTEMS; IR DROP; POWER DELIVERY; THROUGH-SILICON VIA (TSV);

EID: 79960988678     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2010.2053565     Document Type: Article
Times cited : (21)

References (22)
  • 1
    • 0003158656 scopus 로고
    • Hitting the memorywall: Implications of the obvious
    • Mar.
    • W. A. Wulf and S. A. McKee, "Hitting the memorywall: Implications of the obvious," Comput. Arch. News, vol. 23, pp. 20-24, Mar. 1995.
    • (1995) Comput. Arch. News , vol.23 , pp. 20-24
    • Wulf, W.A.1    McKee, S.A.2
  • 2
    • 28344453642 scopus 로고    scopus 로고
    • Bridging the processor-memory performance gap with 3D IC technology
    • DOI 10.1109/MDT.2005.134
    • C. C. Liu, I. Ganusov, M. Burtscher, and S. Tiwari, "Bridging the processor- memory performance gap with 3D IC technology," IEEE Des. Test Comput., vol. 22, no. 6, pp. 556-564, Nov.-Dec. 2005. (Pubitemid 41715963)
    • (2005) IEEE Design and Test of Computers , vol.22 , Issue.6 , pp. 556-564
    • Liu, C.C.1    Ganusov, I.2    Burtscher, M.3    Tiwari, S.4
  • 5
    • 34548359365 scopus 로고    scopus 로고
    • Processor design in 3D die-stacking technologies
    • DOI 10.1109/MM.2007.59
    • G. H. Loh, Y. Xie, and B. Black, "Processor design in 3D die-stacking technologies," IEEE Micro, vol. 27, no. 3, pp. 31-48, May-Jun. 2007. (Pubitemid 47337546)
    • (2007) IEEE Micro , vol.27 , Issue.3 , pp. 31-48
    • Loh, G.H.1    Xie, Y.2    Black, B.3
  • 6
    • 52649125840 scopus 로고    scopus 로고
    • 3D-stacked memory architecture for multi-core processors
    • Jun.
    • G. H. Loh, "3D-stacked memory architecture for multi-core processors," in Proc. 35th ACM/IEEE Int. Conf. Comput. Arch., Jun. 2008, pp. 453-464.
    • (2008) Proc. 35th ACM/IEEE Int. Conf. Comput. Arch. , pp. 453-464
    • Loh, G.H.1
  • 7
    • 61649087224 scopus 로고    scopus 로고
    • Is 3D chip technology the next growth engine for performance improvement?
    • Nov.
    • P. G. Emma and E. Kursun, "Is 3D chip technology the next growth engine for performance improvement?," IBM J. Res. Develop., vol. 32, no. 6, pp. 541-552, Nov. 2008.
    • (2008) IBM J. Res. Develop. , vol.32 , Issue.6 , pp. 541-552
    • Emma, P.G.1    Kursun, E.2
  • 11
    • 61549131161 scopus 로고    scopus 로고
    • 3-D hyperintegration and packaging technologies for micronano systems
    • Jan.
    • J.-Q. Lu, "3-D hyperintegration and packaging technologies for micronano systems," Proc. IEEE, vol. 97, no. 1, pp. 18-30, Jan. 2009.
    • (2009) Proc. IEEE , vol.97 , Issue.1 , pp. 18-30
    • Lu, J.-Q.1
  • 12
    • 33947377467 scopus 로고    scopus 로고
    • An industry perspective on current and future state of the art in system-on-chip (SoC) technology
    • DOI 10.1109/JPROC.2006.873616
    • T. A. C. M. Claasen, "An industry perspective on current and future state of the art in system-on-chip (SoC) technology," Proc. IEEE, vol. 94, no. 6, pp. 1121-1137, Jun. 2006. (Pubitemid 46444962)
    • (2006) Proceedings of the IEEE , vol.94 , Issue.6 , pp. 1121-1137
    • Claasen, T.A.C.M.1
  • 13
    • 34547571626 scopus 로고    scopus 로고
    • Wafer-level three-dimensional hyper-integration technology using dielectric adhesive wafer bonding
    • E. Zschech C. Whelan, and T. Mikolajick, Eds. London, U.K.: Springer-Verlag
    • J.-Q. Lu, T. S. Cale, and R. J. Gutmann, "Wafer-level three-dimensional hyper-integration technology using dielectric adhesive wafer bonding," in Materials for Information Technology: Devices, Interconnects and Packaging, E. Zschech, C. Whelan, and T. Mikolajick, Eds. London, U.K.: Springer-Verlag, 2005, pp. 386-397.
    • (2005) Materials for Information Technology: Devices, Interconnects and Packaging , pp. 386-397
    • Lu, J.-Q.1    Cale, T.S.2    Gutmann, R.J.3
  • 14
    • 79960980900 scopus 로고    scopus 로고
    • Structures and electrical performance of through strata vias (TSVs)
    • Oct.
    • Z. Xu, A. Beece, K. Rose, and J.-Q. Lu, "Structures and electrical performance of through strata vias (TSVs)," in Proc. Int. Wafer-Level Packag. Conf., Oct. 2009, pp. 24-26.
    • (2009) Proc. Int. Wafer-Level Packag. Conf. , pp. 24-26
    • Xu, Z.1    Beece, A.2    Rose, K.3    Lu, J.-Q.4
  • 15
    • 61649092607 scopus 로고    scopus 로고
    • Fabrication and characterization of robust through-silicon vias for silicon-carrier applications
    • Nov.
    • P. S. Andry, C. K. Tsang, B. C. Webb, E. J. Sprogis, S. L. Wright, B. Dang, and D. G. Manzer, "Fabrication and characterization of robust through-silicon vias for silicon-carrier applications," IBM J. Res. Develop., vol. 52, p. 571, Nov. 2008.
    • (2008) IBM J. Res. Develop. , vol.52 , pp. 571
    • Andry, P.S.1    Tsang, C.K.2    Webb, B.C.3    Sprogis, E.J.4    Wright, S.L.5    Dang, B.6    Manzer, D.G.7
  • 16
    • 0346076629 scopus 로고    scopus 로고
    • Contact resistance measurement of bonded copper interconnects for three-dimensional integration technology
    • Jan.
    • K. N. Chen, A. Fan, C. S. Tan, and R. Reif, "Contact resistance measurement of bonded copper interconnects for three-dimensional integration technology," IEEE Electron Device Lett., vol. 25, no. 1, pp. 20-22, Jan. 2004.
    • (2004) IEEE Electron Device Lett. , vol.25 , Issue.1 , pp. 20-22
    • Chen, K.N.1    Fan, A.2    Tan, C.S.3    Reif, R.4
  • 17
    • 79961007019 scopus 로고    scopus 로고
    • INTEL Corporation Santa Clara CA. [Online]. Available
    • INTEL Corporation, Santa Clara, CA, "Xeon processors," 2009. [Online]. Available: http://www.intel.com
    • (2009) Xeon Processors
  • 18
    • 0004245602 scopus 로고    scopus 로고
    • Semiconductor Industry Association. [Online]. Available
    • Semiconductor Industry Association, "The international technology roadmap for semiconductors (ITRS)," 2007. [Online]. Available: http://www.itrs.net/Links/2007ITRS/Home2007.htm
    • (2007) The International Technology Roadmap for Semiconductors (ITRS)
  • 20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.