Phase formation and dielectric properties of Ba0.5Sr 0.5TiO3 by slow injection sol-gel technique

Journal of Materials Science

Volumn 46, Issue 6, 2011, Pages 1806-1813

  Balachandran, R ^a   Yow, H K ^a   Ong, B H ^a   Tan, K B ^b   Anuar, K ^b   Teoh, W T ^c   Ahmad Fauzi, M N ^d   Sreekantan, S ^d   Swaminathan, V ^e  

^a MULTIMEDIA UNIVERSITY   (Malaysia)

^b UNIVERSITY PUTRA MALAYSIA   (Malaysia)

^c NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^d SCHOOL OF CHEMICAL ENGINEERING   (Malaysia)

^e NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE SIZE; CALCINATION TEMPERATURE; CUBIC PEROVSKITE; NANO POWDERS; NARROW SIZE DISTRIBUTIONS; PARTICLE DISTRIBUTIONS; PHASE FORMATIONS; PRECURSOR INJECTION; SINGLE PHASE; SINTERING TEMPERATURES; SOL-GEL TECHNIQUE; STANDARD DEVIATION; TIO;

CALCINATION; CRYSTALLITE SIZE; DIELECTRIC LOSSES; GELS; ORE PELLETS; PELLETIZING; PEROVSKITE; SINTERING; SOL-GEL PROCESS; SOL-GELS; SOLS;

BARIUM;

EID: 79960834959     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-010-5004-4     Document Type: Article

References (40)

1. Tahan DM, Safari A, Klein LC (1996) J Am Ceram Soc 79:1593
2. Parker LH, Tasch AF (1990) IEEE Circuits Devices Mag 6:17
3. Ming-Chieh C, Chun-Feng C, Wen-Tang W, Fuh-Sheng S (2005) J Electrochem Soc 152:F66
4. Zhang R-B, Yang C-S, Ding G-P (2005) Mater Lett 59:1741
5. Auciello O, Saha S, Kaufman DY, Streiffer SK, Fan W, Kabius B, Im J, Baumann P (2004) J Electroceram 12:119
6. Miao J, Chen W-R, Chen B, Yang H, Peng W, Zhong J-P, Wu H, Yuan J, Xu B, Qiu X-G, Cao L-X, Zhao B-R (2004) Chin Phys Lett 21:1139
7. Zhu X, Zheng D, Peng W, Miao J, Li J (2004) J Cryst Growth 268:192
8. Hochul K, Sungho P, Kyekyoon K, Man YS, Hyungsoo C (2004) Electrochem Solid-State Lett 7:F77
9. Chiu MC, Wang CC, Yao HC, Shieu FS (2005) Mater Chem Phys 94:141
10. Xia Y, Wu D, Liu Z (2004) J Phys D 37:2256
11. Morito K, Suzuki T, Kishi H, Sakaguchi I, Ohashi N, Haneda H (2007) IEEE Trans Ultrason Ferroelectr Freq Control 54:2567
12. Roy SC, Sharma GL, Bhatnagar MC, Manchanda R, Balakrishnan VR, Samanta SB (2004) Appl Surf Sci 236:306
13. Lee JM, Kang SY, Shin JC, Kim WJ, Hwang CS, Kim HJ (1999) Appl Phys Lett 74:3489
14. Cheol Seong H, Byoung Taek L, Chang Seok K, Jin Won K, Ki Hoon L, Hag-Ju C, Hideki H, Wan Don K, Sang In L, Young Bum R, Moon Yong L (1998) J Appl Phys 83:3703
15. Yang X, Yao X, Zhang L (2004) Ceram Int 30:1525
16. Su B, Holmes JE, Cheng BL, Button TW (2002) J Electroceram 9:111
17. Berbecaru C, Alexandru HV, Porosnicu C, Velea A, Ioachim A, Nedelcu L, Toacsan M (2008) Thin Solid Films 516:8210
18. Fang T-T, Lin H-B, Hwang J-B (1990) J Am Ceram Soc 73:3363
19. Packia Selvam I, Kumar V (2002) Mater Lett 56:1089
20. Bonnie MMLRER, Gersten L (2004) J Am Ceram Soc 87:2025
21. Reveron H, Elissalde C, Aymonier C, Bousquet C, Maglione M, Cansell F (2006) Nanotechnology 17:3527
22. Xu H, Karadibhave S, Slamovich EB (2007) J Am Ceram Soc 90:2352
23. Wei X, Xu G, Ren Z, Wang Y, Shen G, Han G (2008) J Cryst Growth 310:4132
24. Hou B, Xu Y, Wu D, Sun Y (2006) Powder Technol 170:26
25. Nazeri A, Kahn M, Kidd T (1995) Mater Sci Lett 14:1085
26. Lahiry S, Gupta V, Sreenivas K, Mansingh A (2000) IEEE Trans Ultrason Ferroelectr Freq Control 47:854
27. Majumder SB, Jain M, Martinez A, Katiyar RS, Keuls FWV, Miranda FA (2001) J Appl Phys 90:896
28. Somani V, Kalita S (2007) J Electroceram 18:57
29. Jia QX, Wu XD, Foltyn SR, Tiwari P (1995) Appl Phys Lett 66:2197
30. Fu C, Yang C, Chen H, Wang Y, Hu L (2005) Mater Sci Eng B 119:185
31. Reisinger H, Stengl R (2000) In: Proceedings of the 2000 third IEEE international Caracas conference D26/1
32. Shen C, Liu Q-F, Liu Q (2004) Mater Lett 58:2302
33. Lu Q, Chen D, Jiao X (2003) J Alloys Compd 358:76
34. Li M-l, Liang H, Xu M-X (2008) Mater Chem Phys 112:337
35. Wang YK, Tseng TY, Lin P (2002) Appl Phys Lett 80:3790
36. Li J et al (2005) Model Simul Mater Sci Eng 13:699
37. Dietz GW, Schumacher M, Waser R, Streiffer SK, Basceri C, Kingon AI (1997) J Appl Phys 82:2359
38. Tsai MS, Tseng TY (1999) J Phys D 32:2141
39. Vollmann M, Hagenbeck R, Waser R (1997) J Am Ceram Soc 80:2301
40. Tian H-Y, Choi J, No K, Luo W-G, Ding A-L (2003) Mater Chem Phys 78:138