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Volumn 54, Issue 12, 2007, Pages 2567-2572

Diffusion properties of point defects in barium strontium titanate thin films

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CAPACITORS; DIFFUSION; ELECTRIC PROPERTIES; HYDROGEN; THERMAL DESORPTION SPECTROSCOPY; THIN FILMS;

EID: 42949139472     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2007.578     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 1
    • 33745697524 scopus 로고    scopus 로고
    • 3/Pt capacitors, J. Appl. Phys., 99, art. no. 124105, Jun. 2006.
    • 3/Pt capacitors," J. Appl. Phys., vol. 99, art. no. 124105, Jun. 2006.
  • 3
    • 0025448039 scopus 로고
    • DC electrical degradation of perovskite-type titanates: I. Ceramics
    • Jun
    • R. Waser, T. Baiatu, and K.-H. Hardtl, "DC electrical degradation of perovskite-type titanates: I. Ceramics," J. Amer. Ceram. Soc., vol. 73, pp. 1645-1653, Jun. 1990.
    • (1990) J. Amer. Ceram. Soc , vol.73 , pp. 1645-1653
    • Waser, R.1    Baiatu, T.2    Hardtl, K.-H.3
  • 4
    • 0035455045 scopus 로고    scopus 로고
    • DC-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: Impedance analysis and microstructure
    • Sep
    • H. Chazono and H. Kishi, "DC-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: Impedance analysis and microstructure," Jpn. J. Appl. Phys., vol. 40, pp. 5624-5629, Sep. 2001.
    • (2001) Jpn. J. Appl. Phys , vol.40 , pp. 5624-5629
    • Chazono, H.1    Kishi, H.2
  • 9
    • 7544233726 scopus 로고    scopus 로고
    • Hydrogen-induced defects and degradation in oxide ferroelectrics
    • Sep
    • K. Xiong and J. Robertson, "Hydrogen-induced defects and degradation in oxide ferroelectrics," Appl. Phys. Lett., vol. 85, pp. 2577-2579, Sep. 2004.
    • (2004) Appl. Phys. Lett , vol.85 , pp. 2577-2579
    • Xiong, K.1    Robertson, J.2
  • 10
    • 33646878722 scopus 로고    scopus 로고
    • Resistance degradation due to interstitial hydrogen in photorefractive potassium lithium tantalite niobate single crystals
    • Dec
    • M. Ivker and A. J. Agranat, "Resistance degradation due to interstitial hydrogen in photorefractive potassium lithium tantalite niobate single crystals," J. Appl. Phys., vol. 96, pp. 6405-6408, Dec. 2004.
    • (2004) J. Appl. Phys , vol.96 , pp. 6405-6408
    • Ivker, M.1    Agranat, A.J.2
  • 12
    • 19744368782 scopus 로고    scopus 로고
    • Hydrogen-sensitive amorphous ferroelectric thin film capacitive devices
    • W. Zhu, X. F. Chen, O. K. Tan, and J. Deng, "Hydrogen-sensitive amorphous ferroelectric thin film capacitive devices," Integr. Ferroelect., vol. 44, pp. 25-75, 2002.
    • (2002) Integr. Ferroelect , vol.44 , pp. 25-75
    • Zhu, W.1    Chen, X.F.2    Tan, O.K.3    Deng, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.