Delectric properties of sol-gel derived barium-strontium-titanate (ba0.4sro.6tio3) thin films

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 47, Issue 4, 2000, Pages 854-860

  Lahiry, Sliarmistha ^a  

^a UNIVERSITY OF DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; BARIUM COMPOUNDS; CRYSTALLIZATION; FREE ENERGY; LIGHT POLARIZATION; PERMITTIVITY; SOL-GELS; SUBSTRATES; THIN FILMS;

LANDAU-GINZBURG-DEVONSHIRE METHOD; NONLINEAR DIELECTRIC RESPONSE;

DIELECTRIC FILMS;

EID: 0034230057     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.852067     Document Type: Article

References (20)

1. L. II. Parker and A. F. 'l.'asch, Ferroelectric materials for (I4 Mb and 25o; Mb DRAMS IKKK Circuits Duvicf.fi Magazines, pp. 17-20, 1090.
2. J. F. Scott, Ferroelectric memories Phys. World, pp. 'l(î 50, 1995.
3. K. Buso, F. Baller, H,. Pa.nkra.tli, II. He.sse, and R. Kratzi, 'Thotorcfraetive and related properties oi' Baii.uMTio.ifjTiOa eryst.fl.1 Solid Statt: Commun., vol. 8, pp. 587 53], 1993.
4. F,. Wicner-Avnear, Artificially engineered pyroclcTlric Sri BiiTiO;) superstructure filnm Appl. P/iys. LrM., vol. hTi, pp. 1784 1780, 1994.
5. L. CX Seugiipta and S. Sengupta, Novel fcvru;cloctric materials for pliascd ai'j'ay autoniLîi.s,1 IEEE Traun. Ulf.raso-ii., FcTroclc.:t., Frcq. Onntr., vu]. 44, pp. 792 797, ]'J)7.
6. T. S. Kiin atid Cl II. Kirn, Si riictura.l and clnctrinnl jroperties of rf Liiap;nelroii sputtotrd Bii-_;l.Sva/['iOs Hiiii tilma on iinliuititin-oxide-coatod glass mibstrates J. AppL I-'kya, vol. 75, pp. 7998 003, l)94.
7. S. Ynmamidii, H. Yabula, T. Sakunia, antl Y. MiyasaJta, (Bfi-| Sr)/'.l'i ratio dcpoiiduncu of l.ho diolcctric: propni'l.iRK l'or (Bati.nSi'n.s'f'iOa) thin rilriia picpared by ion bomn sputtering AppL Phy.i. Lett., vol. 64, pp, KM4 1040, 1994.
8. H. Wu, K. Lin, K. Xic, X. Y. Li, .). Li, iind A. Ignutiov, Study ol Btii_Si 'i;'iO.'iflOO) cpitaxîîil Llilii filins prepared by laser rkipoaitiou/' htlvrncitional Synipoxwi-'m on Applicut-ion of FcrtvclcctriiiH '94, i;)9.r), pp. 4(i4-4fi7.
9. H. Kobayaahi tuid T. Kobayashi, l-ictroopitaxiftl growth ol'qnaternnry Bai .-.-L.HivTiOjj tliin films by ArF exciii;ier laser ablation Jpn. J. Appl. Phys., vol. 33, pp. LfiaS-LCSCi, 1994.
10. T. Kawahara, M. Yainainukn, '\\ Makila, K. Tsutahara, A. Yukki, K. Ono, and Y. Matsui, Preparation of (Ha,Sr)TiO:i t.hin films by clieiiiical vapour deposition using liquid sources Jpn. ,L Appl. Phys., vol. M, pp. 5897-5902, 1994.
11. D. Taliau, A. Safari, and L. C. Kloin, Sol-{;cl preparation barium-strontium titannta thin film International Symposium an Application of l''_'.rrii'.lf:cJ.ric,s '94, 1995. pp. 427 430.
12. M. E. IiiiifK n i if l A. M. Glah, Principles and Applications of Jcrtwlw..- ic.t and Itclaicd Mtitviitils. Oxford; (Jlafleron, J.977, p. 71.
13. B. D. Cullity, Elements of X-rny Diffimu-.liim. Und ed. Heading. MA: Addison-Wesley, 1978, p. 102.
14. E. N. Bunting, G. IL Slmll.oii, ami A. S. Creamer, Properties of bjiriimi-stvoiUiimi Titanale dinloctrics J. Amur, Ci'.mm. Soc, vol. 30, pp. 114- 12S, 1947.
15. C. Hnstm-i, S. K. Streiffor, A. I. Kingon, and H. Wasor, The dielectric response as a function of film thickness of fiber tcxtnrod (Ra,Sr)TiO:i thin films grown by eliomica. v.apor deposition J. Appi /%.?., vol. 82, pp. 2497-2504, 1997.
16. |16] P. K. LaiNun, C.I.J.M. Dormans, D. ,1. Taylor, und P. .1. van Veldliuvcn, FciTO(;l(K:tric properties and fatigue of Pbu;r[).n].'J.io.iu;O.i Lliin films of varying tliickiies»: Dlockinp; Inyfir model J. Appl. Pltijs., vol. 7fi, pp. 2402-2413, 1994.
17. K. SreenivaK, A. Mansingh, nnl M. Saycr, StvucLnral and clocI'.riral properties of if spntl.cirril amorplioua bnrium tilfiiifite thin lilms,'1 .1. Appl. Phys., vol. 02, pp. 4475 4481, 19S7.
18. M. Iwabiichi mnl T. Kobayaslii, Growth inid charactorixation of epitaxial SvTiO;) Ihin lilms with proniitiont jmlarizahility J. Appl. Wiys., vol. 75, pp. 5295 53U;1, 1U94.
19. K. Abo and S. Konuvtsu, A-'I.oasuroniont anfl thennoiiynamic, analysis of dielectric; (oiiftl,an1, of cpitaxially grown Sr'l'iO films Jim. .1. Appl. Pliya., vol. 32, ])p. LI 157-1,1 I BO, 1993.
20. S. M. Sxc, Sewicondut'.t.or Di'.vif.c.fi I'h.yHI;fi und Technology. New York: Wiky, 193, p. I GO.