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Applied Physics Letters

Volumn 80, Issue 20, 2002, Pages 3790-3792

Enhanced ferroelectric properties of Pb(Zr0.53Ti 0.47)O3 thin films on SrRuO3/Ru/SiO 2/Si substrates

(3) Wang, Y K a Tseng, T Y a Lin, Pang a

a NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING PROCESS; APPLIED FIELD; APPLIED VOLTAGES; BIPOLAR PULSE; COERCIVE FIELD; CRYSTALLINITIES; DEPOSITION TEMPERATURES; FATIGUE-FREE CHARACTERISTICS; FERROELECTRIC PROPERTY; PZT; PZT FILM; SWITCHING CYCLES; VARIOUS SUBSTRATES;

ANNEALING; LEAD; POLARIZATION; SOL-GEL PROCESS; ZIRCONIUM;

SUBSTRATES;

EID: 79956025673 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1480099 Document Type: Article

Times cited : (83)

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