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Volumn 8, Issue 7-8, 2011, Pages 2251-2254

Effect of basal-plane stacking faults on the Bragg peak broadening in m-plane GaN

Author keywords

Bragg peak broadening; Nitrides; Stacking faults; X ray diffraction

Indexed keywords

ASYMMETRIC GEOMETRY; BRAGG PEAKS; COHERENCE LENGTHS; M-PLANE; MICRO-STRAIN;

EID: 79960725388     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.201001140     Document Type: Article
Times cited : (3)

References (13)
  • 3
    • 79960714818 scopus 로고
    • X-ray Diffraction (Addison-Wesley Publ. Co., Reading, Mass., ).
    • B. E. Warren, X-ray Diffraction (Addison-Wesley Publ. Co., Reading, Mass., 1969).
    • (1969)
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.