Substrate effect and application of the elastic foundation model to evaluate atomic force microscope nanoindentations of thin polymeric films

Polymer Engineering and Science

Volumn 51, Issue 8, 2011, Pages 1507-1512

  Tranchida, Davide ^a   Lilge, Inga ^a   Schönherr, Holger ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM THICKNESS; THICK FILMS; THIN FILMS;

ATOMIC FORCE; ELASTIC FOUNDATION MODEL; FILM-THICKNESS; N-BUTYL METHACRYLATE; NANO INDENTATION; SUBSTRATE EFFECTS; THIN POLYMERIC FILMS; THIN-FILMS; WINKLER ELASTIC FOUNDATION;

NANOINDENTATION;

EID: 79960162770     PISSN: 00323888     EISSN: 15482634     Source Type: Journal    
DOI: 10.1002/pen.21947     Document Type: Article

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