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Volumn 43, Issue 4, 2001, Pages 1343-1348
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Dynamics of the leveling process of nanoindentation induced defects on thin polystyrene films
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Author keywords
Polymer; Polymer physical chemistry; Polymer science
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEFECTS;
DIFFUSION;
POLYSTYRENES;
SUBSTRATES;
NANOINDENTATION;
THIN FILMS;
POLYMER;
POLYSTYRENE;
SILICON;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
DIFFUSION;
FILM;
MOLECULAR DYNAMICS;
TEMPERATURE SENSITIVITY;
THICKNESS;
FILM;
POLYSTYRENE;
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EID: 0035842360
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(01)00688-7 Document Type: Article |
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Times cited : (22)
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References (24)
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