Nanomechanical properties of mechanical double-layers: A novel semiempirical analysis

Langmuir

Volumn 23, Issue 21, 2007, Pages 10779-10787

  Cappella, B ^a   Silbernagl, D ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; ELASTIC MODULI; ESTIMATION; FILM THICKNESS; GLASS; MATHEMATICAL MODELS; NANOMECHANICS; STIFFNESS;

FORCE-DISPLACEMENT CURVES; GLASS SUBSTRATES; MECHANICAL DOUBLE-LAYERS; POLY(N-BUTYL METHACRYLATE);

THIN FILMS;

EID: 35448965085     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la701234q     Document Type: Article

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