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Volumn 326, Issue 1, 2011, Pages 23-27
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Low-temperature soluble InZnO thin film transistors by microwave annealing
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Author keywords
A1. Microwave annealing; B1. Zinc compounds; B2. Oxide semiconducting materials; B3. Field effect transistors
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Indexed keywords
ACTIVE LAYER;
B1. ZINC COMPOUNDS;
B2. OXIDE SEMICONDUCTING MATERIALS;
DEVICE CHARACTERISTICS;
FIELD EFFECTS;
FLEXIBLE DEVICE;
HIGH PERFORMANCE APPLICATIONS;
INDIUM ZINC OXIDES;
LOW TEMPERATURES;
MICROWAVE ANNEALING;
ON/OFF CURRENT RATIO;
OXIDE SEMICONDUCTOR;
PROCESSABLE;
SOLUTION-PROCESSED;
SUBTHRESHOLD SLOPE;
ANNEALING;
FIELD EFFECT TRANSISTORS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
INDIUM;
IRRADIATION;
MICROWAVE HEATING;
THIN FILM DEVICES;
THIN FILM TRANSISTORS;
THIN FILMS;
TRANSISTORS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
ZINC;
ZINC COMPOUNDS;
ZINC OXIDE;
MICROWAVE IRRADIATION;
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EID: 79960155950
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2011.01.044 Document Type: Conference Paper |
Times cited : (45)
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References (26)
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