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Volumn 326, Issue 1, 2011, Pages 23-27

Low-temperature soluble InZnO thin film transistors by microwave annealing

Author keywords

A1. Microwave annealing; B1. Zinc compounds; B2. Oxide semiconducting materials; B3. Field effect transistors

Indexed keywords

ACTIVE LAYER; B1. ZINC COMPOUNDS; B2. OXIDE SEMICONDUCTING MATERIALS; DEVICE CHARACTERISTICS; FIELD EFFECTS; FLEXIBLE DEVICE; HIGH PERFORMANCE APPLICATIONS; INDIUM ZINC OXIDES; LOW TEMPERATURES; MICROWAVE ANNEALING; ON/OFF CURRENT RATIO; OXIDE SEMICONDUCTOR; PROCESSABLE; SOLUTION-PROCESSED; SUBTHRESHOLD SLOPE;

EID: 79960155950     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2011.01.044     Document Type: Conference Paper
Times cited : (45)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.