Fault diagnosis in reversible circuits under missing-gate fault model

Computers and Electrical Engineering

Volumn 37, Issue 4, 2011, Pages 475-485

  Rahaman, Hafizur ^a   Kole, Dipak K ^a   Das, Debesh K ^b   Bhattacharya, Bhargab B ^c  

^a INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

^b JADAVPUR UNIVERSITY   (India)

^c INDIAN STATISTICAL INSTITUTE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BIT-SHIFTS; CONTROL LINES; FAULT MODEL; MISSING GATE FAULTS; NOVEL TECHNIQUES; REVERSIBLE CIRCUITS; TEST VECTORS; TESTABLE DESIGN; UNIVERSAL TEST;

LOGIC GATES;

FAULT DETECTION;

EID: 79960006155     PISSN: 00457906     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.compeleceng.2011.05.005     Document Type: Article

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