A family of logical fault models for reversible circuits

Proceedings of the Asian Test Symposium

Volumn 2005, Issue , 2005, Pages 422-427

  Polian, Ilia ^a   Hayes, John P ^b   Fiehn, Thomas ^a   Becker, Bernd ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

ATPG; Fault models; Quantum circuits; Reversible circuits

Indexed keywords

ENERGY DISSIPATION; INTEGER PROGRAMMING; LINEAR PROGRAMMING; LOGIC GATES; MATHEMATICAL MODELS; QUANTUM THEORY;

ATPG; LOGICAL FAULT MODELS; QUANTUM CIRCUITS; REVERSIBLE CIRCUITS;

LOGIC CIRCUITS;

EID: 33846898079     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2005.9     Document Type: Conference Paper

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