Non-destructive characterization of structural hierarchy within aligned carbon nanotube assemblies

Journal of Applied Physics

Volumn 109, Issue 9, 2011, Pages

  Verploegen, Eric ^a   Hart, A John ^b   De Volder, Michael ^c   Tawfick, Sameh ^b   Chia, Khek Khiang ^a   Cohen, Robert E ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNED CARBON NANOTUBES; AS-GROWN; BULK PROPERTIES; CHARACTERIZATION METHODS; HIERARCHICAL SELF-ASSEMBLY; HIERARCHICAL STRUCTURES; HIGH-DENSITY; ISOLATED AND BUNDLED; MACRO SCALE; MICROSCOPY TECHNIQUE; MULTI-WALL CNT; NON-DESTRUCTIVE MEASUREMENT; NONDESTRUCTIVE CHARACTERIZATION; POST PROCESSING; PROCESSING METHOD; STRUCTURAL HIERARCHIES; TRANSPARENT CONDUCTORS; VERTICALLY ALIGNED;

CHEMICAL VAPOR DEPOSITION; MICROELECTRONICS; PROCESSING; WALLS (STRUCTURAL PARTITIONS); X RAY SCATTERING;

CARBON NANOTUBES;

EID: 79959522889     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3584759     Document Type: Article

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