-
1
-
-
0035440047
-
-
Muller, B.; Riedel, M.; Michel, R.; De Paul, S. M.; Hofer, R.; Heger, D.; Grutzmacher, D. J. Vac. Sci. Technol. B 2001, 19, 1715.
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, pp. 1715
-
-
Muller, B.1
Riedel, M.2
Michel, R.3
De Paul, S.M.4
Hofer, R.5
Heger, D.6
Grutzmacher, D.7
-
2
-
-
0037006873
-
-
Feng, L.; Li, S. H.; Li, H. J.; Zhai, J.; Song, Y. L.; Jiang, L.; Zhu, D. B. Angew. Chem., Int. Ed. 2002, 41, 1221.
-
(2002)
Angew. Chem., Int. Ed.
, vol.41
, pp. 1221
-
-
Feng, L.1
Li, S.H.2
Li, H.J.3
Zhai, J.4
Song, Y.L.5
Jiang, L.6
Zhu, D.B.7
-
3
-
-
0042303439
-
-
Love, J. C; Gates, B. D.; Wolfe, B. D.; Kateri, E. P.; Whitesides, G. M. Nano Lett. 2002, 2, 891.
-
(2002)
Nano Lett.
, vol.2
, pp. 891
-
-
Love, J.C.1
Gates, B.D.2
Wolfe, B.D.3
Kateri, E.P.4
Whitesides, G.M.5
-
4
-
-
0035805346
-
-
Li, H. J.; Wang, X. B.; Song, Y. L.; Liu, Y. Q.; Li, Q. S.; Jiang, L.; Zhu, D. B. Angew. Chem., Int. Ed. 2001, 40, 1743.
-
(2001)
Angew. Chem., Int. Ed.
, vol.40
, pp. 1743
-
-
Li, H.J.1
Wang, X.B.2
Song, Y.L.3
Liu, Y.Q.4
Li, Q.S.5
Jiang, L.6
Zhu, D.B.7
-
5
-
-
0347992816
-
-
Lau, K. K. S.; Bico, J.; Teo, K. B. K.; Chhowalla, M.; Amaratunga, G. A. J.; Milne, W. I.; McKinley, G. H.; Gleason, K. K. Nano Lett. 2003, 3, 1701.
-
(2003)
Nano Lett.
, vol.3
, pp. 1701
-
-
Lau, K.K.S.1
Bico, J.2
Teo, K.B.K.3
Chhowalla, M.4
Amaratunga, G.A.J.5
Milne, W.I.6
McKinley, G.H.7
Gleason, K.K.8
-
6
-
-
1242297726
-
-
Shiu, J.-Y.; Kuo, C.-W.; Chen, P.; Mou, C.-Y. Chem. Mater. 2004, 16, 561.
-
(2004)
Chem. Mater.
, vol.16
, pp. 561
-
-
Shiu, J.-Y.1
Kuo, C.-W.2
Chen, P.3
Mou, C.-Y.4
-
7
-
-
2542436965
-
-
Fan, J.; Tang, X.; Zhao, Y.-P. Nanotechnology 2004, 15, 501.
-
(2004)
Nanotechnology
, vol.15
, pp. 501
-
-
Fan, J.1
Tang, X.2
Zhao, Y.-P.3
-
11
-
-
0242440095
-
-
Karabacak, T.; Singh, J. P.; Zhao, Y.-P.; Wang, G.-C.; Lu, T.-M. Phys. Rev. B 2003, 68, 125408.
-
(2003)
Phys. Rev. B
, vol.68
, pp. 125408
-
-
Karabacak, T.1
Singh, J.P.2
Zhao, Y.-P.3
Wang, G.-C.4
Lu, T.-M.5
-
12
-
-
0000924511
-
-
Voss, R. F.; Laibowitz, R. B.; Allessandrini, E. I. Phys. Rev. Lett. 1982, 49, 1441.
-
(1982)
Phys. Rev. Lett.
, vol.49
, pp. 1441
-
-
Voss, R.F.1
Laibowitz, R.B.2
Allessandrini, E.I.3
-
14
-
-
0000874671
-
-
Amar, J. G.; Family, F. F.; Lam, P.-M. Phys. Rev. B 1994, 50, 8781.
-
(1994)
Phys. Rev. B
, vol.50
, pp. 8781
-
-
Amar, J.G.1
Family, F.F.2
Lam, P.-M.3
-
15
-
-
9644296216
-
-
note
-
We used Image Tool (v3.00, developed at UTHSCSA by Don Wilcox et al.) to process the SEM pictures. In general the nanorod SEM images have a binomial distribution in brightness. We selected the threshold as the minimum brightness between the binomial peaks and convert the pictures to black and white. By counting the black and white pixels, we obtained the coverage.
-
-
-
-
17
-
-
0001358040
-
-
Kralchevsky, P. A.; Paunov, V. N.; Denkov, N. D.; Ivanov, I. B.; Nagayama, K. J. Colloid Interface Sci. 1993, 155, 420.
-
(1993)
J. Colloid Interface Sci.
, vol.155
, pp. 420
-
-
Kralchevsky, P.A.1
Paunov, V.N.2
Denkov, N.D.3
Ivanov, I.B.4
Nagayama, K.5
|