Thallium chalcogenide-based wide-band-gap semiconductors: TlGaSe 2 for radiation detectors

Chemistry of Materials

Volumn 23, Issue 12, 2011, Pages 3120-3128

  Johnsen, Simon ^a   Liu, Zhifu ^b   Peters, John A ^b   Song, Jung Hwan ^a   Peter, Sebastian C ^a   Malliakas, Christos D ^a   Cho, Nam Ki ^b   Jin, Hosub ^a   Freeman, Arthur J ^a   Wessels, Bruce W ^b   Kanatzidis, Mercouri G ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b Northwestern University   (United States)

Author keywords

chalcogenide; crystal growth; gamma ray detector; photoconductivity; radiation detector; semiconductor; TlGaSe2

Indexed keywords

ABSORPTION MEASUREMENTS; CLEAVED SURFACES; COMMERCIAL MATERIALS; CORNER-SHARING TETRAHEDRA; ELECTRONIC BAND STRUCTURE CALCULATION; ELECTRONS AND HOLES; FULL POTENTIAL LINEARIZED AUGMENTED PLANE WAVE METHOD; GALLIUM SELENIDES; GAMMA-RAY DETECTOR; HOLE EFFECTIVE MASS; LAYERED CRYSTAL STRUCTURE; MATERIAL SYSTEMS; MODIFIED BRIDGMAN METHOD; SEMICONDUCTOR; SIGNAL RESPONSE; SINGLE CRYSTAL X-RAY DIFFRACTION; SPACE GROUPS; SPIN-ORBIT COUPLINGS; TLGASE2; WIDE-BAND-GAP SEMICONDUCTOR;

CRYSTAL GROWTH FROM MELT; CRYSTAL STRUCTURE; CRYSTALLIZATION; GAMMA RAYS; PHASE CHANGE MEMORY; PHOTOCONDUCTIVITY; PHOTOELECTRICITY; RADIATION DAMAGE; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; THALLIUM; X RAY DIFFRACTION;

RADIATION DETECTORS;

EID: 79959387922     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm200946y     Document Type: Article

References (60)

1. Milbrath, B. D.; Peurrung, A. J.; Bliss, M.; Weber, W. J. J. Mater. Res. 2008, 23, 2561-2581
2. Schlesinger, T. E.; Toney, J. E.; Yoon, H.; Lee, E. Y.; Brunett, B. A.; Franks, L.; James, R. B. Mater. Sci. Eng., R 2001, 32, 103-189
3. Owens, A.; Peacock, A. Nucl. Instrum. Methods Phys. Res., Sect. A 2004, 531, 18-37
4. Owens, A. J. Synchrotron Rad. 2006, 13, 143-150
5. McGregor, D. S.; Hermon, H. Nucl. Instrum. Methods Phys. Res., Sect. A 1997, 395, 101-124
6. Szeles, C. Phys. Status Solidi B 2004, 241, 783-790
7. Amman, M.; Lee, J. S.; Luke, P. N. J. Appl. Phys. 2002, 92, 3198-3206
8. Panich, A. M. J. Phys.: Condens. Matter 2008, 20, 293202
9. Acikgoz, M.; Kazan, S.; Mikailov, F. A. Appl. Spectrosc. Rev. 2009, 44, 181-209
10. Delgado, G. E.; Mora, A. J.; Perez, F. V.; Gonzalez, J. Cryst. Res. Technol. 2007, 42, 663-666
11. Henkel, W.; Hochheimer, H. D.; Carlone, C.; Werner, A.; Ves, S.; Vonschnering, H. G. Phys. Rev. B 1982, 26, 3211-3221
12. El-Nahass, M. M.; Sallam, M. M.; Rahman, S. A.; Ibrahim, E. M. Solid State Sci. 2006, 8, 488-499
13. Seltzer, S. M. Radiat. Res. 1993, 136, 147-170
14. Ekinci, N.; Gurol, A.; Durna, D.; Gurbulak, B. Anal. Lett. 2010, 43, 1999-2008
15. Knuteson, D. J.; Singh, N. B.; Kahler, D.; Wagner, B.; Berghmans, A.; McLaughlin, S.; Schwartz, K. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 1st ed.; James, R. B.; Franks, L. A.; Burger, A., Eds.; Proceedings of SPIE, Vol. 7449; SPIE: San Diego, CA, 2009; p 744918.
16. Kahler, D.; Singh, N. B.; Knuteson, D. J.; Wagner, B.; Berghmans, A.; McLaughlin, S.; King, M.; Schwartz, K.; Suhre, D.; Gotlieb, M. Nucl. Instrum. Methods Phys. Res., Sect. A 2010, DOI 10.1016/j.nima.2010.09.057.
17. Morgant, G.; Legendre, B.; Maneglier-Lacordaire, S.; Souleau, C. Ann. Chim.-Sci. Mater. 1981, 6, 315-326
18. Laugier, J.; Filhol, A. J. Appl. Crystallogr. 1983, 16, 281-283
19. Hanias, M. P.; Anagnostopoulos, A. N.; Kambas, K.; Spyridelis, J. Mater. Res. Bull. 1992, 27, 25-38
20. Qasrawi, A. F.; Gasanly, N. M. Mater. Res. Bull. 2004, 39, 1353-1359
21. Kalomiros, J. A.; Kalkan, N.; Hanias, M.; Anagnostopoulos, A. N.; Kambas, K. Solid State Commun. 1995, 96, 601-607
22. Wimmer, E.; Krakauer, H.; Weinert, M.; Freeman, A. J. Phys. Rev. B 1981, 24, 864-875
23. Bylander, D. M.; Kleinman, L. Phys. Rev. B 1990, 41, 7868-7871
24. Kashida, S.; Yanadori, Y.; Otaki, Y.; Seki, Y.; Panich, A. M. Phys. Status Solidi A 2006, 203, 2666-2669
25. Panich, A. M. Appl. Magn. Reson. 2004, 27, 29-39
26. Panich, A. M.; Kashida, S. J. Phys.: Condens. Matter 2004, 16, 3071-3080
27. McMorrow, D. F.; Cowley, R. A.; Hatton, P. D.; Banys, J. J. Phys.: Condens. Matter 1990, 2, 3699-3712
28. Banis, J.; Brilingas, A.; Grigas, J.; Guseinov, G. Fiz. Tverd. Tela 1987, 29, 3324-3329
29. Kim, J.; Hughbanks, T. J. Solid State Chem. 2000, 149, 242-251
30. Manfredo, C; Murri, R.; Rizzo, A.; Galassin., S; Ruggiero, L. Phys. Rev. B 1974, 10, 3387-3393
31. Shigetomi, S.; Ikari, T.; Nishimura, N. Phys. Status Solidi A 2001, 185, 341-348
32. Gasanly, N. M.; Serpenguzel, A.; Aydinli, A.; Baten, S. M. A. J. Lumin. 2000, 86, 39-43
33. Bakhyshov, A. E.; Boules, S.; Faradzhov, F. E.; Mamedov, M. S.; Tagirov, V. I. Phys. Status Solidi B 1979, 95, K121-K125
34. Smith, R. A. Semiconductors; Cambridge University Press: Cambridge, U.K., 1959.
35. Alig, R. C.; Bloom, S. Phys. Rev. Lett. 1975, 35, 1522-1525
36. Qasrawi, A. F.; Gasanly, N. M. Semicond. Sci. Technol. 2004, 19, 505-509
37. Capozzi, V.; Montagna, M. Phys. Rev. B 1989, 40, 3182-3190
38. Guseinov, G. D.; Abdullayev, G. B.; Bidzinova, S. M.; Seidov, F. M.; Ismailov, M. Z.; Pashayev, A. M. Phys. Lett. A 1970, 33, 421-422
39. Bera, T. K.; Jang, J. I.; Song, J. H.; Malliakas, C. D.; Freeman, A. J.; Ketterson, J. B.; Kanatzidis, M. G. J. Am. Chem. Soc. 2010, 132, 3484-3495
40. Bera, T. K.; Song, J. H.; Freeman, A. J.; Jang, J. I.; Ketterson, J. B.; Kanatzidis, M. G. Angew. Chem., Int. Ed. 2008, 47, 7828-7832
41. Biswas, K.; Zhang, Q. C.; Chung, I.; Song, J. H.; Androulakis, J.; Freeman, A. J.; Kanatzidis, M. G. J. Am. Chem. Soc. 2010, 132, 14760-14762
42. Chung, I.; Song, J. H.; Jang, J. I.; Freeman, A. J.; Ketterson, J. B.; Kanatzidis, M. G. J. Am. Chem. Soc. 2009, 131, 2647-2656
43. Tsamourtzi, K.; Song, J. H.; Bakas, T.; Freeman, A. J.; Trikalitis, P. N.; Kanatzidis, M. G. Inorg. Chem. 2008, 47, 11920-11929
44. Ye, L. H.; Hoang, K.; Freeman, A. J.; Mahanti, S. D.; He, J.; Tritt, T. M.; Kanatzidis, M. G. Phys. Rev. B 2008, 77
45. Shaban, H. T. Mater. Chem. Phys. 2010, 119, 131-134
46. Madelung, O. Semiconductors: Data Handbook, 3 rd ed.; Springer: Berlin, 2004.
47. Ashraf, I. M.; Abdel-Rahman, M. M.; Badr, A. M. J. Phys. D: Appl. Phys. 2003, 36, 109-113
48. Prokesch, M.; Szeles, C. J. Appl. Phys. 2006, 100, 8
49. Burger, A.; Groza, M.; Cui, Y.; Hillman, D.; Brewer, E.; Bilikiss, A.; Wright, G. W.; Li, L.; Fu, F.; James, R. B. J. Electron. Mater. 2003, 32, 756-760
50. Wright, G.; Cui, Y.; Roy, U. N.; Barnett, C.; Reed, K.; Burger, A.; Lu, F.; Li, L.; James, R. B. IEEE Trans. Nucl. Sci. 2002, 49, 2521-2525
51. Ruzin, A.; Nemirovsky, Y. Appl. Phys. Lett. 1997, 71, 2214-2215
52. Burshtein, Z.; Akujieze, J. K.; Silberman, E. J. Appl. Phys. 1986, 60, 3182-3187
53. Cui, Y.; Wright, G.; Kolokolnikov, K.; Barnett, C.; Reed, K.; Roy, U. N.; Burger, A.; James, R. B. In Hard X-Ray and Gamma-Ray Detector Physics III; Proceedings of SPIE, Vol. 4507; James, R. B., Ed.; SPIE: Bellingham, WA, 2001; pp 12-22.
54. Many, A. J. Phys. Chem. Solids 1965, 26, 575
55. Cui, Y.; Groza, M.; Wright, G. W.; Roy, U. N.; Burger, A.; Li, L.; Lu, F.; Black, M. A.; James, R. B. J. Electron. Mater. 2006, 35, 1267-1274
56. Zanichelli, M.; Pavesi, M.; Zappettini, A.; Marchini, L.; Auricchio, N.; Caroli, E.; Manfredi, M. IEEE Trans. Nucl. Sci. 2009, 56, 3591-3596
57. Sheleg, A. U.; Iodkovskaya, K. V.; Kurilovich, N. F. Phys. Solid State 1998, 40, 1208-1210
58. Kapoor, S. S.; Ramamurthy, V. S. Nuclear Radiation Detectors; New Age International Ltd.: New Delhi, India, 1986.
59. Qasrawi, A. F.; Gasanly, N. M. Phys. Scr. 2007, 76, 249-252
60. Qasrawi, A. F.; Gasanly, N. M. Philos. Mag. 2008, 88, 2899-2906