Passivation and surface leakage in CdZnTe spectrometers

Applied Physics Letters

Volumn 71, Issue 15, 1997, Pages 2214-2215

  Ruzin, A ^a   Nemirovsky, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001411291     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120450     Document Type: Article

References (5)

1. xTe spectrometers for gamma and x-ray applications," in Semiconductors for Room Temperature Nuclear Detector Applications, Vol. 43 of Semiconductors and Semimetals, edited by T. E. Schlesinger and R. B. James (Academic, New York, 1995), p. 335.
2. J. F. Butler, "CdTe and CdZnTe as gamma-ray and x-ray detector materials," in Properties of Narrow Gap Cadmium Based Compounds, edited by P. Capper, Reviews Series, No. 10 (INSPEC, London, 1994), p. 587.
3. A. Ruzin, D. Sc. Thesis, Technion, 1996.
4. Y. Nemirovsky, A. Ruzin, G. Asa, and Y. Gorelik, J. Electron. Mater. 26, 756 (1997).
5. "eV Products," Saxonburg Boulevard, Saxonburg, PA 16056.