Characterization of bulk and surface transport mechanisms by means of the photocurrent technique

IEEE Transactions on Nuclear Science

Volumn 56, Issue 6, 2009, Pages 3591-3596

  Zanichelli, Massimiliano ^a   Pavesi, Maura ^b   Zappettini, Andrea ^c   Marchini, Laura ^c   Auricchio, Natalia ^d   Caroli, Ezio ^d   Manfredi, Manfredo ^b  

^a GP Usberti 7/A   (Italy)

^b UNIVERSITY OF PARMA   (Italy)

^c IMEM CNR   (Italy)

^d OSSERVATORIO ASTRONOMICO DI BOLOGNA   (Italy)

Author keywords

CdZnTe detector; Photocurrent; Transport properties characterization; X ray spectroscopy

Indexed keywords

BAND EDGE; BAND GAPS; BIAS POLARITY; BULK DEFECTS; BULK PROPERTIES; BULK TRAPS; CDZNTE DETECTOR; CDZNTE DETECTORS; DIFFERENT EFFECTS; FIXED WAVELENGTH; HIGH ENERGY REGIONS; HOLE TRANSPORTS; METAL CONTACTS; PHOTOCURRENT MEASUREMENT; PHOTOCURRENT SPECTRUM; PHOTON FLUX; RECOMBINATION CENTERS; SHAPE DIFFERENCE; SPECTROSCOPIC DETECTORS; SURFACE QUALITIES; SURFACE STATE; SURFACE TRANSPORT; TRANSPORT PARAMETERS;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; CONTACTS (FLUID MECHANICS); DETECTORS; PHOTOCURRENTS; SURFACES; TRANSPORT PROPERTIES; X RAY SPECTROSCOPY;

SURFACE DEFECTS;

EID: 72349093419     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2032098     Document Type: Conference Paper

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