Third-order aberration theory of Wien filters for monochromators and aberration correctors

Journal of Microscopy

Volumn 217, Issue 3, 2005, Pages 205-215

  Tsuno, Katsu ^a   Ioanoviciu, D ^b   Martinez G ^c  

^a JEOL LTD   (Japan)

^b NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

^c UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Aberration corrector; Aberrations; Chromatic aberration; Energy filter; Monochromator; Spherical aberration; Wien filter

Indexed keywords

BANDPASS FILTERS; MONOCHROMATORS;

ABERRATION CORRECTORS; APERTURE ABERRATIONS; CHROMATIC ABERRATION; CONDITION; ELECTRIC FIELD COMPONENTS; ENERGY FILTER; SPHERICAL ABERRATIONS; THIRD ORDER ABERRATION THEORY; THIRD-ORDER ABERRATION; WIEN FILTERS;

ABERRATIONS;

ARTICLE; COLOR; ELECTRIC FIELD; FILTER; GEOMETRY; MAGNETIC FIELD; OPTICS; PRIORITY JOURNAL; THEORY;

EID: 14744292314     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01443.x     Document Type: Article

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