High-resolution spin-polarized scanning electron microscopy (spin SEM)

Journal of Electron Microscopy

Volumn 59, Issue 1, 2010, Pages 43-52

  Kohashi, Teruo ^a,b   Konoto, Makoto ^a,c   Koike, Kazuyuki ^b,c  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b HITACHI LTD   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

High resolution; Magnetic domain; Magnetic recording; Secondary electrons; SEM; Spin

Indexed keywords

ELECTRON GUNS; ELECTRONS; MAGNETIC DOMAINS; MAGNETIC RECORDING; POLARIMETERS; PROBES; SECONDARY EMISSION; SIGNAL TO NOISE RATIO; SPIN POLARIZATION;

ELECTRON TRAJECTORIES; HIGH RESOLUTION; NM RESOLUTION; OBJECTIVE LENS; SECONDARY ELECTRONS; SEM IMAGE; SIMULATION PROJECTS; SPIN; SPIN-POLARIZED; THREE-DIMENSIONAL (3-D) SIMULATION;

SCANNING ELECTRON MICROSCOPY;

EID: 76649100409     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfp047     Document Type: Article

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