Development of an 0.2eV energy resolution analytical electron microscope

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 68-69

  Tanaka, M ^a   Terauchi, M ^a   Tsuda, K ^a   Saitoh, K ^a   Mukai, M ^b   Kaneyama, T ^b   Tomita, T ^b   Tsuno, K ^b   Kersker, M ^c   Naruse, M ^b   Honda, T ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

^c JEOL USA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18644366383     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602101838     Document Type: Conference Paper

References (5)

1. M. Terauchi, M. Tanaka, K. Tsuno and M. Ishida: J. Microscopy, 194 (1999) 203.
2. M. Terauchi and M. Tanaka: J. Surface Analysis, 3 (1997) 240.
3. M. Tanaka et al.: J. Microscopy, 194 (1999) 219.
4. K. Tsuda and M. Tanaka: Acta Cryst., A55 (1999) 939.
5. M. Tanaka et al.: Inst. Phys. Conf. Ser., 165 (2000) 217.