A new circuit simplification method for error tolerant applications

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2011, Pages 1566-1571

  Shin, Doochul ^a   Gupta, Sandeep K ^a  

^a University of Southern California   (United States)

Author keywords

ATPG; circuit optimization; DCT; Error tolerance; redundancy removal

Indexed keywords

ATPG; CIRCUIT OPTIMIZATION; DCT; ERROR TOLERANCE; REDUNDANCY REMOVAL;

APPROXIMATION ALGORITHMS; BUDGET CONTROL; COSINE TRANSFORMS; ELECTRIC NETWORK ANALYSIS; ERRORS; OPTIMIZATION;

LOGIC CIRCUITS;

EID: 79957541498     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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