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Volumn 46, Issue 14, 2011, Pages 4913-4921
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Electrical, morphological and structural properties of RF magnetron sputtered Mo thin films for application in thin film photovoltaic solar cells
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Author keywords
[No Author keywords available]
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Indexed keywords
BACK CONTACT;
DEPOSITED FILMS;
ELECTRICAL CONDUCTIVITY;
LATTICE STRESS;
PHOTOVOLTAIC SOLAR CELLS;
POST DEPOSITION ANNEALING;
PREFERRED ORIENTATIONS;
PROCESS PRESSURE;
RADIO FREQUENCY MAGNETRON SPUTTERING;
RESIDUAL OXYGEN;
RF MAGNETRONS;
SPUTTERING POWER;
SPUTTERING PRESSURES;
THIN FILM SOLAR CELLS;
X-RAY DIFFRACTION DATA;
ELECTRIC CONDUCTIVITY;
MOLYBDENUM;
NANOSTRUCTURED MATERIALS;
SOLAR CELLS;
SOLAR POWER GENERATION;
X RAY DIFFRACTION;
THIN FILMS;
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EID: 79956099931
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-011-5404-0 Document Type: Article |
Times cited : (57)
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References (21)
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