Study of the Mo thin films and Mo/CIGS interface properties

Applied Surface Science

Volumn 246, Issue 1-3, 2005, Pages 159-166

  Assmann, L ^a   Bernede J C ^a   Drici, A ^a   Amory, C ^a   Halgand, E ^a   Morsli, M ^a  

^a UNIVERSITÉ DE NANTES   (France)

Author keywords

Contact resistance; Interface; Molybdenum; Sputtering; Thin film

Indexed keywords

DIODES; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; MOLYBDENUM COMPOUNDS; SOLAR CELLS; SPUTTERING; THIN FILMS;

CONTACT RESISTANCE; INTERFACE PROPERTIES; INTERNAL CONSTRAINTS; TARGET-SUBSTRATE DISTANCE;

SURFACE PROPERTIES;

EID: 17744379168     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.11.020     Document Type: Article

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