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Volumn 20, Issue 5, 2008, Pages
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The effect of deposition parameters on radiofrequency sputtered molybdenum thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
HIGH PRESSURE EFFECTS;
PARAMETER ESTIMATION;
SPUTTER DEPOSITION;
STRAIN RATE;
SUBSTRATES;
DEPOSITION PARAMETERS;
GLASS SUBSTRATES;
MOLYBDENUM THIN FILMS;
STRAIN REVERSAL;
THIN FILMS;
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EID: 43049114986
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/20/05/055206 Document Type: Article |
Times cited : (59)
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References (17)
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