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Volumn 7970, Issue , 2011, Pages

Approaches to rapid resist spreading on dispensing based UV-NIL

Author keywords

Imprint; Ink jet; Resist; UV NIL

Indexed keywords

AIR ATMOSPHERE; AIR BUBBLES; AREA DENSITY; BRIDGE FORMATION; DISSOLUTION SPEED; DISSOLUTION TIME; DROPLET SIZES; FILLING PROCESS; IMPRINT; IN-VACUUM; INK-JET; LOW VISCOSITY; RESIST; UV-NANOIMPRINT LITHOGRAPHY; UV-NIL;

EID: 79955879669     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.879200     Document Type: Conference Paper
Times cited : (12)

References (12)
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  • 3
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    • Ikuo Yoneda, Shinji Mikami, Takumi Ota, Takeshi Koshiba, Masamitsu Ito, Tetsuro Nakasugi, Tatsuhiko Higashiki," Study of nanoimprint lithography for applications toward 22nm node CMOS devices," Proc. of SPIE, Vol.6921, 692104 (2008)
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    • Yoneda, I.1    Mikami, S.2    Ota, T.3    Koshiba, T.4    Ito, M.5    Nakasugi, T.6    Higashiki, T.7
  • 4
    • 77953298999 scopus 로고    scopus 로고
    • High volume jet and flash imprint lithography for discrete track patterned media
    • Zhengmao Ye, Rick Ramos, Cynthia Brooks, Paul Hellebrekers, Scott Carden and Dwayne LaBrake, "High volume jet and flash imprint lithography for discrete track patterned media," Proc. of SPIE, Vol.7637, 76371A (2010)
    • (2010) Proc. of SPIE , vol.7637
    • Ye, Z.1    Ramos, R.2    Brooks, C.3    Hellebrekers, P.4    Carden, S.5    LaBrake, D.6
  • 5
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    • Step and flash imprint lithography for semiconductor high volume manufacturing?
    • M. Malloy and L. C. Litt, "Step and flash imprint lithography for semiconductor high volume manufacturing?" Proc. SPIE Vol. 7637, 763706 (2010)
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    • Malloy, M.1    Litt, L.C.2
  • 6
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    • Air bubble formation and dissolution in dispensing nanoimprint lithography
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    • Liang, X.1    Hua, T.2    Fu, Z.3    Chou, S.Y.4
  • 8
    • 24644474741 scopus 로고    scopus 로고
    • Simulation of fluid flow in the step and flash imprint lithography process
    • S. Reddy, R.T. Bonnecaze, "Simulation of fluid flow in the step and flash imprint lithography process," Microelectron. Eng., Vol.82 60 (2005)
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    • Reddy, S.1    Bonnecaze, R.T.2
  • 9
    • 37149009562 scopus 로고    scopus 로고
    • UV-nanoimprint with the assistance of gas condensation at atmospheric environmental pressure
    • Hiroshi Hiroshima, Masanori Komuro, "UV-nanoimprint with the assistance of gas condensation at atmospheric environmental pressure," J. Vac. Sci. Technol. B 25, 2333 (2007)
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  • 11
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    • Influence of the molecular weight and imprint conditions on the formation of capillary bridges in nanoimprint lithography
    • N Chaix, C Gourgon, S Landis, C Perret, M Fink, F Reuther, D Mecerreyes, "Influence of the molecular weight and imprint conditions on the formation of capillary bridges in nanoimprint lithography," Nanotechnology Vol.17 4082 (2006)
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    • Chaix, N.1    Gourgon, C.2    Landis, S.3    Perret, C.4    Fink, M.5    Reuther, F.6    Mecerreyes, D.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.