Partially coherent nano-focused x-ray radiation characterized by Talbot interferometry

Optics Express

Volumn 19, Issue 10, 2011, Pages 9656-9675

  Salditt, T ^a   Kalbfleisch, S ^a   Osterhoff, M ^a   Kruger S P ^a   Bartels, M ^a   Giewekemeyer, K ^a   Neubauer, H ^a   Sprung, M ^a,b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; CURVE FITTING; INTERFEROMETRY; MIRRORS; WAVEGUIDES;

BEAM DIAMETERS; COHERENCE LENGTHS; FOCAL SPOT SIZE; GRATING INTERFEROMETRY; HIGH FLUX DENSITY; IMAGING APPLICATIONS; IN-LINE; MIRROR SYSTEMS; NUMERICAL APERTURE; NUMERICAL CALCULATION; PARTIAL COHERENCE; PARTIALLY COHERENT; PROJECTION GEOMETRY; PROJECTION IMAGING; SPATIAL COHERENCE; SPATIAL COHERENCE PROPERTIES; TALBOT INTERFEROMETRY; TEST PATTERN; TYPICAL VALUES; X RAY BEAM; X RAY RADIATION; X-RAY WAVEGUIDES;

X RAYS;

EID: 79955826036     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.009656     Document Type: Article

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