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Volumn 59, Issue 10, 2011, Pages 3759-3769

Effects of stress on phase separation in InxGa1- xN/GaN multiple quantum-wells

Author keywords

Electron energy loss spectroscopy (EELS); Nitrides; Scanning transmission electron microscopy (STEM); Spinoidal

Indexed keywords

AS-GROWN; ATOMIC-RESOLUTION; GAN/SAPPHIRE; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-RESOLUTION X-RAY DIFFRACTION; HRXRD; LATERAL DIRECTIONS; LINE SCAN; METALORGANIC CHEMICAL VAPOR DEPOSITION; MULTIPLE QUANTUM WELLS; PEAK EMISSIONS; RECIPROCAL SPACE MAPPING; RED SHIFT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCANNING/TRANSMISSION ELECTRON MICROSCOPY (STEM); SPINOIDAL; VERTICAL DIRECTION; WELL WIDTH;

EID: 79955554731     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.11.020     Document Type: Article
Times cited : (15)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.