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Volumn 106, Issue 11, 2009, Pages

A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

AUGER RECOMBINATION; AVERAGE VALUES; CONVENTIONAL TECHNIQUES; ELECTRO-OPTICAL; GAN BASED LED; INGAN/GAN; LED STRUCTURE; NON-RADIATIVE; PACKAGED DEVICE; RECOMBINATION DYNAMICS; RECOMBINATION PARAMETERS; THEORETICAL SIMULATION; WORK SUPPORT;

EID: 72449187514     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3266014     Document Type: Article
Times cited : (113)

References (11)
  • 8
    • 0019576239 scopus 로고
    • METHOD FOR DETERMINING EFFECTIVE NONRADIATIVE LIFETIME NAD LEAKAGE LOSSES IN DOUBLE-HETEROSTRUCTURE LASERS.
    • DOI 10.1063/1.329845
    • C. van Opdorp and G. W. t Hooft, J. Appl. Phys. 0021-8979 52, 3827 (1981). 10.1063/1.329845 (Pubitemid 12430296)
    • (1981) Journal of Applied Physics , vol.52 , Issue.6 , pp. 3827-3839
    • Van Opdorp, C.1    T'Hooft, G.W.2
  • 10
    • 0006009502 scopus 로고    scopus 로고
    • Identification of aging mechanisms in the optical and electrical characteristics of light-emitting diodes
    • DOI 10.1063/1.1413721
    • O. Pursiainen, N. Linder, A. Jaeger, R. Oberschmid, and K. Streubel, Appl. Phys. Lett. 0003-6951 79, 2895 (2001). 10.1063/1.1413721 (Pubitemid 33608091)
    • (2001) Applied Physics Letters , vol.79 , Issue.18 , pp. 2895-2897
    • Pursiainen, O.1    Linder, N.2    Jaeger, A.3    Oberschmid, R.4    Streubel, K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.