-
1
-
-
0032516703
-
-
0036-8075, 10.1126/science.281.5379.956
-
S. Nakamura, Science 0036-8075 281, 956 (1998). 10.1126/science.281.5379. 956
-
(1998)
Science
, vol.281
, pp. 956
-
-
Nakamura, S.1
-
2
-
-
0034710677
-
Nirtride semiconductors free of electrostatic fields for efficient white light-emitting diodes
-
DOI 10.1038/35022529
-
P. Waltereit, O. Brandt, A. Trampert, H. T. Grahn, J. Menniger, M. Ramsteiner, M. Reiche, and K. H. Ploog, Nature (London) 0028-0836 406, 865 (2000). 10.1038/35022529 (Pubitemid 30664256)
-
(2000)
Nature
, vol.406
, Issue.6798
, pp. 865-868
-
-
Waltereit, P.1
Brandt, O.2
Trampert, A.3
Grahn, H.T.4
Monniger, J.5
Ramsteiner, M.6
Relche, M.7
Ploog, K.H.8
-
3
-
-
0347874296
-
-
0021-8979, 10.1063/1.371971
-
S. C. Jain, M. Willander, J. Narayan, and R. Van Overstraeten, J. Appl. Phys. 0021-8979 87, 965 (2000). 10.1063/1.371971
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 965
-
-
Jain, S.C.1
Willander, M.2
Narayan, J.3
Van Overstraeten, R.4
-
4
-
-
67650711664
-
-
0021-8979, 10.1063/1.3155798
-
J. Wu, J. Appl. Phys. 0021-8979 106, 011101 (2009). 10.1063/1.3155798
-
(2009)
J. Appl. Phys.
, vol.106
, pp. 011101
-
-
Wu, J.1
-
5
-
-
20644450567
-
Luminescence properties of defects in GaN
-
DOI 10.1063/1.1868059, 061301
-
M. A. Reshchikov and H. Morko̧, J. Appl. Phys. 0021-8979 97, 061301 (2005). 10.1063/1.1868059 (Pubitemid 40833704)
-
(2005)
Journal of Applied Physics
, vol.97
, Issue.6
, pp. 1-95
-
-
Reshchikov, M.A.1
Morko, H.2
-
6
-
-
0032181962
-
-
0022-3727, 10.1088/0022-3727/31/20/001
-
O. Ambacher, J. Phys. D: Appl. Phys. 0022-3727 31, 2653 (1998). 10.1088/0022-3727/31/20/001
-
(1998)
J. Phys. D: Appl. Phys.
, vol.31
, pp. 2653
-
-
Ambacher, O.1
-
7
-
-
0037429809
-
-
0003-6951, 10.1063/1.1558216
-
L. W. Tu, C. L. Hsiao, T. W. Chi, I. Lo, and K. Y. Hsieh, Appl. Phys. Lett. 0003-6951 82, 1601 (2003). 10.1063/1.1558216
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 1601
-
-
Tu, L.W.1
Hsiao, C.L.2
Chi, T.W.3
Lo, I.4
Hsieh, K.Y.5
-
8
-
-
0026255726
-
-
0167-577X, 10.1016/0167-577X(91)90001-M
-
J. Ross and M. Robin, Mater. Lett. 0167-577X 12, 215 (1991). 10.1016/0167-577X(91)90001-M
-
(1991)
Mater. Lett.
, vol.12
, pp. 215
-
-
Ross, J.1
Robin, M.2
-
9
-
-
0032369087
-
Growth and characterization of GaN thin films by magnetron sputter epitaxy
-
DOI 10.1116/1.581059
-
P. Singh, J. M. Corbett, J. B. Webb, S. Charbonneau, F. Yang, and M. D. Robertson, J. Vac. Sci. Technol. A 0734-2101 16, 786 (1998). 10.1116/1.581059 (Pubitemid 128046800)
-
(1998)
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
, vol.16
, Issue.2
, pp. 786-789
-
-
Singh, P.1
Corbett, J.M.2
Webb, J.B.3
Charbonneau, S.4
Yang, F.5
Robertson, M.D.6
-
10
-
-
21544448562
-
-
(Research Signpost, Trivandrum)
-
J. Birch, S. Tungasmita, and V. Darakchieva, Vacuum Science and Technology: Nitrides as Seen by the Technology (Research Signpost, Trivandrum, 2002), pp. 421-456.
-
(2002)
Vacuum Science and Technology: Nitrides As Seen by the Technology
, pp. 421-456
-
-
Birch, J.1
Tungasmita, S.2
Darakchieva, V.3
-
11
-
-
34248547898
-
Topotaxial growth of Ti2 AlN by solid state reaction in AlNTi (0001) multilayer thin films
-
DOI 10.1063/1.2731520
-
C. Höglund, M. Beckers, N. Schell, J. V. Borany, J. Birch, and L. Hultman, Appl. Phys. Lett. 0003-6951 90, 174106 (2007). 10.1063/1.2731520 (Pubitemid 46759214)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.17
, pp. 174106
-
-
Hoglund, C.1
Beckers, M.2
Schell, N.3
Borany, J.V.4
Birch, J.5
Hultman, L.6
-
12
-
-
21544462609
-
Magnetron sputter epitaxy of wurtzite Al1-x Inx N (0.1
-
DOI 10.1063/1.1870111, 083503
-
T. Seppänen, P. O. Å. Persson, L. Hultman, G. Z. Radnóczi, and J. Birch, J. Appl. Phys. 0021-8979 97, 083503 (2005). 10.1063/1.1870111 (Pubitemid 40920565)
-
(2005)
Journal of Applied Physics
, vol.97
, Issue.8
, pp. 1-9
-
-
Seppanen, T.1
Persson, P.O.A.2
Hultman, L.3
Birch, J.4
Radnoczi, G.Z.5
-
14
-
-
0000007445
-
-
0021-8979, 10.1063/1.370635
-
M. Yamaguchi, T. Yagi, T. Sota, T. Deguchi, K. Shimada, and S. Nakamura, J. Appl. Phys. 0021-8979 85, 8502 (1999). 10.1063/1.370635
-
(1999)
J. Appl. Phys.
, vol.85
, pp. 8502
-
-
Yamaguchi, M.1
Yagi, T.2
Sota, T.3
Deguchi, T.4
Shimada, K.5
Nakamura, S.6
-
15
-
-
34247212899
-
Surface-morphology evolution and strain relaxation during heteroepitaxial growth of GaN films without low-temperature nucleation layers
-
DOI 10.1063/1.2721401
-
S. Lee, H. Choe, T. Oh, J. W. Jean, B. Shin, Y. Sohn, C. Kim, J. Choi, Y. -T. Moon, and J. S. Lee, Appl. Phys. Lett. 0003-6951 90, 151905 (2007). 10.1063/1.2721401 (Pubitemid 46609828)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.15
, pp. 151905
-
-
Lee, S.1
Choe, H.2
Oh, T.3
Jean, J.W.4
Shin, B.5
Sohn, Y.6
Kim, C.7
Choi, J.8
Moon, Y.-T.9
Lee, J.S.10
-
16
-
-
0742285734
-
-
0021-8979, 10.1063/1.1634388
-
J. -K. Tsai, I. Lo, K. -L. Chuang, L. -W. Tu, J. -H. Huang, C. -H. Hsieh, and K. -Y. Hsieh, J. Appl. Phys. 0021-8979 95, 460 (2004). 10.1063/1.1634388
-
(2004)
J. Appl. Phys.
, vol.95
, pp. 460
-
-
Tsai, J.-K.1
Lo, I.2
Chuang, K.-L.3
Tu, L.-W.4
Huang, J.-H.5
Hsieh, C.-H.6
Hsieh, K.-Y.7
-
17
-
-
0035539907
-
-
0370-1972, 10.1002/1521-3951(200111)228:2<403::AID-PSSB403>3.0. CO;2-5
-
R. Chierchia, T. Böttcher, S. Figge, M. Diesselberg, H. Heinke, and D. Hommel, Phys. Status Solidi B 0370-1972 228, 403 (2001). 10.1002/1521- 3951(200111)228:2<403::AID-PSSB403>3.0.CO;2-5
-
(2001)
Phys. Status Solidi B
, vol.228
, pp. 403
-
-
Chierchia, R.1
Böttcher, T.2
Figge, S.3
Diesselberg, M.4
Heinke, H.5
Hommel, D.6
-
18
-
-
0038347880
-
-
0021-4922, 10.1143/JJAP.42.2265
-
B. -R. Shim, H. Okita, K. Jeganathan, M. Shimizu, and H. Okumura, Jpn. J. Appl. Phys., Part 1 0021-4922 42, 2265 (2003). 10.1143/JJAP.42.2265
-
(2003)
Jpn. J. Appl. Phys., Part 1
, vol.42
, pp. 2265
-
-
Shim, B.-R.1
Okita, H.2
Jeganathan, K.3
Shimizu, M.4
Okumura, H.5
-
19
-
-
0032056159
-
-
0141-8610, 10.1080/01418619808221225
-
T. Metzger, R. Höpler, E. Born, O. Ambacher, M. Stutzmann, R. Stömmer, M. Schuster, H. Göbel, S. Christiansen, M. Albrecht, and H. P. Sturnk, Philos. Mag. A 0141-8610 77, 1013 (1998). 10.1080/01418619808221225
-
(1998)
Philos. Mag. A
, vol.77
, pp. 1013
-
-
Metzger, T.1
Höpler, R.2
Born, E.3
Ambacher, O.4
Stutzmann, M.5
Stömmer, R.6
Schuster, M.7
Göbel, H.8
Christiansen, S.9
Albrecht, M.10
Sturnk, H.P.11
-
20
-
-
36449004125
-
Role of threading dislocation structure on the x-ray diffraction peak widths in epitaxial GaN films
-
DOI 10.1063/1.116495, PII S0003695196004056
-
B. Heying, X. H. Wu, S. Keller, Y. Li, D. Kapolnek, B. P. Keller, S. P. DenBaars, and J. S. Speck, Appl. Phys. Lett. 0003-6951 68, 643 (1996). 10.1063/1.116495 (Pubitemid 126683916)
-
(1996)
Applied Physics Letters
, vol.68
, Issue.5
, pp. 643-645
-
-
Heying, B.1
Wu, X.H.2
Keller, S.3
Li, Y.4
Kapolnek, D.5
Keller, B.P.6
Denbaars, S.P.7
Speck, J.S.8
-
21
-
-
0026414655
-
-
0022-0248, 10.1016/0022-0248(91)90816-N
-
K. Hiramatsu, S. Itoh, H. Amano, and I. Akasaki, J. Cryst. Growth 0022-0248 115, 628 (1991). 10.1016/0022-0248(91)90816-N
-
(1991)
J. Cryst. Growth
, vol.115
, pp. 628
-
-
Hiramatsu, K.1
Itoh, S.2
Amano, H.3
Akasaki, I.4
-
22
-
-
70349375837
-
-
1610-1634, 10.1002/pssc.200880918
-
P. P. Paskov, B. Monemar, T. Paskova, E. A. Preble, A. D. Hanser, and K. R. Evans, Phys. Status Solidi C 1610-1634 6, S763 (2009). 10.1002/pssc.200880918
-
(2009)
Phys. Status Solidi C
, vol.6
, pp. 763
-
-
Paskov, P.P.1
Monemar, B.2
Paskova, T.3
Preble, E.A.4
Hanser, A.D.5
Evans, K.R.6
-
23
-
-
77958090133
-
-
0003-6951, 10.1063/1.3492841
-
J. L. Lyons, A. Janotti, and C. G. Van de Walle, Appl. Phys. Lett. 0003-6951 97, 152108 (2010). 10.1063/1.3492841
-
(2010)
Appl. Phys. Lett.
, vol.97
, pp. 152108
-
-
Lyons, J.L.1
Janotti, A.2
Van De Walle, C.G.3
|