Role of threading dislocation structure on the x-ray diffraction peak widths in epitaxial GaN films

Applied Physics Letters

Volumn , Issue , 1995, Pages 643-

  Heying, B ^a   Wu, X H ^a   Keller, S ^a   Li, Y ^a   Kapolnek, D ^a   Keller, B P ^a   Denbaars, S P ^a   Speck, J S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

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EID: 36449004125     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116495     Document Type: Article

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