An approach to single event testing of SDRAMs

IEEE Transactions on Nuclear Science

Volumn 57, Issue 5 PART 3, 2010, Pages 2923-2928

  Adell, Philippe C ^a   Edmonds, Larry ^a   McPeak, Richard ^b   Scheick, Leif ^a   McClure, Steve S ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NONE

Author keywords

Micro displacement; SDRAMs; single event effects; stuck bits

Indexed keywords

GRAPHICAL MAPPINGS; MICRODISPLACEMENT; PATTERN IDENTIFICATION; SDRAM MEMORY; SDRAMS; SINGLE EVENT EFFECTS; SINGLE-EVENT TESTING; SINGLE-EVENTS; STUCK BITS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 79953794546     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2010.2059711     Document Type: Article

References (10)

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