Investigation of the mechanism of stuck bits in high capacity SDRAMs

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2008, Pages 47-52

  Scheick, Leif ^a   Guertin, Steve ^a   Nguyen, Duc ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUENCE; HIGH CAPACITIES; IN CELLS; RETENTION TIMES;

RADIATION; SENSITIVITY ANALYSIS; TECHNICAL PRESENTATIONS;

RADIATION EFFECTS;

EID: 56349139265     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2008.15     Document Type: Conference Paper

References (15)

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