TID test for SDRAM based IEEM calibration system

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2004, Pages 752-755

  Bertazzoni, Stefane ^a   Di Giovenale, Domenico ^a   Salmeri, Marcello ^a   Mongiardo, Lorenzo ^a   Florean, Marco ^a   Salsano, Adelio ^d   Wyss, Jeffery ^b   Rando, Riccardo ^c  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

^c UNIVERSITY OF PADOVA   (Italy)

^d NONE

Author keywords

COTS; IEEM; SDRAM; TID

Indexed keywords

ELECTRON EMISSION; FIELD PROGRAMMABLE GATE ARRAYS; GAMMA RAYS; MICROELECTRONICS; MICROPROCESSOR CHIPS; NUCLEAR PHYSICS; PHOTONS; STATIC RANDOM ACCESS STORAGE;

COMMERCIAL OFF THE SELF (COTS); ION ELECTRON EMISSION MICROSCOPY (IEEM); SDRAM; TOTAL INTEGRATED DOSE (TID);

ELECTRON MICROSCOPY;

EID: 23844470584     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. B.L. Doyle, G. Vizkelethy, D.S. Walsh, B. Senftinger, and M. Mellon, "A new approach to nuclear microscopy: the ion electron emission microscope." Nuclear Instruments and Methods in Physics Research B, Elsevier, no. 158, pp. 6-17, 1999.
2. D. Bisello, A. Kaminsky, A. Magalini, M. Nigro, D. Pantano, S. Sedykh, and I. Wyss, "Ion electron emission microscopy at the SIRAD single event effect facility," Nuclear Instruments and Methods in Physics Research B, Elsevier, no. 181, pp. 275-257, 2001.
3. J. Wyss, D. Bisello, and D. Pantano, "SIRAD: an irradiation facility at the LNL tandem accelerator for radiation damage studies on silicon detectors, electronic devices and systems," Nuclear Instruments and Methods in Physics Research A, Elsevier, vol. 462, pp. 426-434, 2001.
4. D. Bisello, A. Candelori, M. Dal Maschio, P. Giubilato, A. Kaminski, M. Nigro, D. Pantano, R. Rando, S. Sedykh, M. Tessaro, and J. Wyss, "Status of the ion electron emission microscope at the SIRAD single event effect facility," Nuclear Instruments and Methods in Physics Research B. Elsevier, vol. 210, pp. 142-146, 2003.
5. S. Bertazzoni, G.C. Cardarilli, G.C. Grande, D. Piergentili, M. Salmeri, S. Sperandei, S. Bartalucci, G. Mazenga, M. Ricci, V. Bidoli, D. De Francesco, E. Reali, and A. Rovelli, "Tests of 64 Mb SDRAM for space applications," in European Conference on Circuit Theory and Design, Stresa, Italy, August 1999.
6. S. Bertazzoni, G.C. Cardarilli, D. Di Giovenale, G.C. Grande, P. Marinucci, D. Piergentili, M. Salmeri, A. Salsano, S. Sperandei, S. Bartalucci, G. Mazenga, M. Ricci, V. Bidoli, D. De Francesco, P.G. Picozza, and A. Rovelli, "Failure tests on 64 Mb SDRAM in radiation environments," in IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Albuquerque, New Mexico, USA, November 1999.