Heavy ion testing with iron at 1 GeV/amu

IEEE Transactions on Nuclear Science

Volumn 57, Issue 5 PART 3, 2010, Pages 2948-2954

  Pellish, Jonathan A ^a   Xapsos, Michael A ^a   Label, Kenneth A ^a   Marshall, Paul W ^b   Heidel, David F ^c   Rodbell, Kenneth P ^c   Hakey, Mark C ^d   Dodd, Paul E ^e   Shaneyfelt, Marty R ^e   Schwank, James R ^e   Baumann, Robert C ^f   Deng, Xiaowei ^f   Marshall, Andrew ^f   Sierawski, Brian D ^g   Black, Jeffrey D ^g   Reed, Robert A ^g   Schrimpf, Ronald D ^g   Kim, Hak S ^a   Berg, Melanie D ^a   Campola, Michael J ^a   Friendlich, Mark R ^a   Perez, Christopher E ^a   Phan, Anthony M ^a   Seidleck, Christina M ^a   more..

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b NASA HEADQUARTERS   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

^d IBM   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

^f TEXAS INSTRUMENTS   (United States)

^g VANDERBILT UNIVERSITY   (United States)

Author keywords

FPGA; galactic cosmic ray; heavy ion testing; SRAM

Indexed keywords

DEVICE RESPONSE; ENERGY PEAKS; FPGA; GALACTIC COSMIC RAY; HEAVY ION TESTING; MICROELECTRONIC COMPONENTS; RADIATION TRANSPORT; SPACE RADIATION EFFECTS; SRAM; SRAM-BASED FPGA; TILT ANGLE;

COSMIC RAYS; GALAXIES; HEAVY IONS; IRRADIATION; MICROELECTRONICS; NASA;

RADIATION EFFECTS;

EID: 79953775595     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2010.2066575     Document Type: Article

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