Analysis of single event effects at grazing angle

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 pt 3, 1998, Pages 1603-1611

  Campbell, A B ^a   Musseau, O ^a   Ferlet Cavrois, V ^a   Stapor, W J ^a   McDonald, P T ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; COSMIC RAYS; IONS; STATISTICAL METHODS;

ADJACENT REVERSE BIASED STRUCTURES; MULTIPLE BIT UPSETS; SINGLE EVENT EFFECTS;

INTEGRATED CIRCUITS;

EID: 0032095632     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685247     Document Type: Article

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