Domain crossing errors: Limitations on single device triple-modular redundancy circuits in xilinx FPGAs

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2037-2043

  Quinn, Heather ^a   Morgan, Keith ^a   Graham, Paul ^a   Krone, Jim ^a   Caffrey, Michael ^a   Lundgreen, Kevin ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b BRIGHAM YOUNG UNIVERSITY   (United States)

Author keywords

Fault tolerance; Field programmable gate arrays; Hardness measurement; Proton radiation effects; Radiation hardening; Redundant systems

Indexed keywords

ERROR ANALYSIS; FAULT TOLERANCE; PROTON IRRADIATION; RADIATION HARDENING; REDUNDANCY;

HARDNESS MEASUREMENT; PROTON RADIATION EFFECTS; REDUNDANT SYSTEMS;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 37249039063     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.910870     Document Type: Conference Paper

References (6)

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