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Volumn 55, Issue 4, 2008, Pages 2259-2266

Effectiveness of internal versus external SEU scrubbing mitigation strategies in a Xilinx FPGA: Design, test, and analysis

Author keywords

Field programmable gate array (FPGA); Reconfiguration; Scrubbing; Xilinx

Indexed keywords

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 53349127605     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2001422     Document Type: Conference Paper
Times cited : (121)

References (17)
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  • 6
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    • The NASA goddard space flight center radiation effects and analysis group Virtex-4 scrubber
    • presented at the, Jun. 2007 [Online, Available:, unpublished
    • M. Berg, "The NASA goddard space flight center radiation effects and analysis group Virtex-4 scrubber," presented at the Xilinx Insertion Meeting, Albuquerque, NM, Jun. 2007 [Online]. Available: http://www.nepp.nasa. gov/workshops/xilinx/June2007Status/Pres_11.ppt#1, unpublished
    • Xilinx Insertion Meeting, Albuquerque, NM
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  • 7
    • 84954092841 scopus 로고    scopus 로고
    • SEE mitigation strategies for digital circuit design applicable to ASIC and FPGAs
    • presented at the, Honolulu, HI, Jul. 23, Part II of the Short Course, unpublished
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    • Fault tolerance implementation within SRAM based FPGA design based upon the increased level of single event upset susceptibility,
    • M. Berg, "Fault tolerance implementation within SRAM based FPGA design based upon the increased level of single event upset susceptibility, " in Proc. IEEE Int. On-Line Test Symp., 2006, pp. 89-91.
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    • 33846387083 scopus 로고    scopus 로고
    • An analysis of single event upset dependencies on high frequency and architectural implementations within actel RTAX-S family field programmable gate arrays
    • Dec
    • M. Berg et al., "An analysis of single event upset dependencies on high frequency and architectural implementations within actel RTAX-S family field programmable gate arrays," IEEE Trans. Nucl. Sci., vol. 53, no. 6, Dec. 2006.
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    • P. Graham, H. Quinn, J. Krone, M. Caffrey, S. Rezgui, and C. Carmichael, Radiation-induced multi-bit upsets in Xilinx SRAM-based FPGAs, presented at the MAPLD, Washington, DC, Sep. 2005.
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    • J. W. Howard, H. Kim, M. Berg, and K. A. LaBel et al., "Development of a low cost and high speed single event effects tester based on reconfigurable field programmable gate arrays (FPGA)," presented at the SEE Symp. 2006, Long Beach, CA, Apr. 2006, unpublished.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.