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Volumn , Issue , 2011, Pages 352-355

Above-IC generic poly-SiGe thin film wafer level packaging and MEM device technology: Application to accelerometers

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE TECHNOLOGIES; ELECTRO-MECHANICAL; HERMETICITY; IN-VACUUM; N2 ATMOSPHERES; PLATFORM TECHNOLOGY; POLY-SIGE THIN FILMS; REFERENCE DEVICES; STANDARD CMOS; WAFER LEVEL PACKAGING;

EID: 79953770734     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MEMSYS.2011.5734434     Document Type: Conference Paper
Times cited : (22)

References (11)
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  • 2
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  • 3
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    • Boston, USA
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  • 7
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    • (2008) Microelectronics Reliability , vol.48 , pp. 1557
    • Li, Q.1
  • 8
    • 65949109309 scopus 로고    scopus 로고
    • Robust wafer-level thin-film encapsulation of microstructures using low stress PECVD silicon carbide
    • Sorrento, Italy
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  • 9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.