The self-weight deformation of an x-ray interferometer

Metrologia

Volumn 48, Issue 2, 2011, Pages

  Ferroglio, L ^a,b   Mana, G ^a   Massa, E ^a  

^a ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^b INSTITUT LAUE LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LATTICE PARAMETERS; LATTICE STRAIN; SELF-WEIGHT; UNCERTAINTY BUDGET; X-RAY INTERFEROMETERS;

FINITE ELEMENT METHOD; UNCERTAINTY ANALYSIS; X RAY ANALYSIS;

INTERFEROMETERS;

EID: 79953706325     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/48/2/S08     Document Type: Article

References (7)

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2. 28Si x-ray interferometer Metrologia 48 S37-43
3. Ferroglio L, Mana G and Massa E 2008 Si lattice parameter measurement by centimeter x-ray interferometry Opt. Express 16 16877-88
4. Bonse U and Hart M 1965 An x-ray interferometer Appl. Phys. Lett. 6 155-6
5. Mana G and Vittone E 1997 Scanning LLL x-ray interferometrty: II. Aberration analysis Z. Phys. B 102 197-206 (Pubitemid 127817741)
6. Bergamin A, Cavagnero A, Mana G, Massa E and Zosi G 2000 Simulation of the thermoelastic behavior of an LLL x-ray interferometer Rev. Sci. Instrum. 71 1716-22
7. Mana G, Massa E and Ferroglio L 2009 Observation of a bent crystal-lattice by x-ray interferometry Opt. Express 17 11172-8