Structural and optical properties of both pure poly(3-octylthiophene) (P3OT) and P3OT/fullerene films

Thin Solid Films

Volumn 450, Issue 1, 2004, Pages 97-100

  Erb, Tobias ^a   Raleva, Sofiya ^a   Zhokhavets, Uladzimir ^a   Gobsch, Gerhard ^a   Stühn, Bernd ^a   Spode, Matthias ^a   Ambacher, Oliver ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Fullerene; Morphology; Poly(3 octylthiophene); Spectral ellipsometry; X Ray diffraction

Indexed keywords

ANISOTROPY; DIELECTRIC MATERIALS; ELLIPSOMETRY; ESTERS; LIGHT EMITTING DIODES; MORPHOLOGY; OPTICAL SYSTEMS; SPECTROSCOPIC ANALYSIS; SPIN COATING; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FULLERENE FILMS; POLY(93-OCTYLTHIOPHENE); SPECTRAL ELLIPSOMETRY;

SEMICONDUCTING POLYMERS;

EID: 1142279632     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.045     Document Type: Conference Paper

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