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Volumn 25, Issue 2, 2011, Pages 171-230

Control of the casimir force using semiconductor test bodies

Author keywords

Casimir effect; charge carrier density; semiconductor

Indexed keywords


EID: 79953665312     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217979211057736     Document Type: Article
Times cited : (54)

References (126)
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    • http://www.ioffe.ru/SVA/NSM
  • 76
    • 79953830940 scopus 로고    scopus 로고
    • http://www.prhoffman.com/technical/scratch-dig.htm.
  • 77
    • 79953832353 scopus 로고    scopus 로고
    • http://www.ispoptics.com/PDFs/PDFCatalog/Page55.pdf//www.ispoptics.com/ PDFs/PDFCatalog/Page55.pdf.
  • 84
    • 84892299362 scopus 로고    scopus 로고
    • Measurement errors and uncertainties
    • Springer-Verlag New York
    • S. G. Rabinovich, Measurement Errors and Uncertainties. Theory and Practice (Springer-Verlag, New York, 2000).
    • Theory and Practice , pp. 2000
    • Rabinovich, S.G.1
  • 101


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.