Investigation of the Casimir force between metal and semiconductor test bodies

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 72, Issue 2, 2005, Pages

  Chen, F ^a   Mohideen, U ^a   Klimchitskaya, G L ^b   Mostepanenko, V M ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SAINT PETERSBURG MINING UNIVERSITY   (Russian Federation)

^c Noncommercial Partnership Scientific Instruments   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CASIMIR FORCE; ROOT-MEAN-SQUARE DEVIATION; SEMICONDUCTOR TEST BODIES; SILICON PLATE;

ATOMIC FORCE MICROSCOPY; DISSIMILAR METALS; METALS; SEMICONDUCTOR MATERIALS; SILICON; SINGLE CRYSTALS; SPHERES; STATISTICAL METHODS;

FORCE MEASUREMENT;

EID: 27144432410     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.72.020101     Document Type: Article

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