Experimental test for the conductivity properties from the Casimir force between metal and semiconductor

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 74, Issue 2, 2006, Pages

  Chen, F ^a,b,c   Mohideen, U ^a,b,c   Klimchitskaya, G L ^b,c   Mostepanenko, V M ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SAINT PETERSBURG MINING UNIVERSITY   (Russian Federation)

^c Noncommercial Partnership Scientific Instruments   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ERROR ANALYSIS; MEASUREMENT THEORY; RANDOM PROCESSES; STATISTICAL METHODS;

ATOMIC FORCE MICROSCOPES; CASIMIR FORCE; DIELECTRIC PLATES;

SEMICONDUCTOR MATERIALS;

EID: 33747163559     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.74.022103     Document Type: Article

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