Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction

Philosophical Magazine

Volumn 91, Issue 7-9, 2011, Pages 1256-1264

  Kirchlechner, C ^a,b   Kiener, D ^a,c   Motz, C ^a   Labat, S ^d   Vaxelaire, N ^d   Perroud, O ^d   Micha, J S ^e,f   Ulrich, O ^e,f   Thomas, O ^d   Dehm, G ^a,b   Keckes, J ^b  

^a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^b UNIVERSITY OF LEOBEN   (Austria)

^c MATERIALS CENTER LEOBEN FORSCHUNG GMBH   (Austria)

^d AIX MARSEILLE UNIVERSITÉ   (France)

^e CEA GRENOBLE   (France)

^f EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

deformation mechanism; diffraction; dislocation structures; in situ electron microscopy; mechanical testing; plasticity

Indexed keywords

DEFORMATION MECHANISM; DEFORMATION STRUCTURE; DISLOCATION STRUCTURES; IN SITU ELECTRON MICROSCOPY; IN-SITU; LOW STRAINS; MULTIPLE SLIPS; SCANNING ELECTRON MICROSCOPES; SINGLE SLIP; SINGLE-CRYSTALLINE; SLIP STEPS; SLIP SYSTEM; SYNCHROTRON X RAYS; TENSILE SPECIMENS; THICK SAMPLES; X RAY MICRODIFFRACTION;

ACTIVATION ANALYSIS; DEFORMATION; DIFFRACTION; ELECTRONS; MATERIALS TESTING; MECHANICAL ENGINEERING; PLASTICITY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

PLASTICITY TESTING;

EID: 79952644894     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786431003785639     Document Type: Article

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